Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871994 | Information processing device and information processing method | — | 2020-12-22 |
| 10833924 | Data collecting apparatus, data collecting method, and program | Yusuke Matsushita | 2020-11-10 |
| 10805399 | Data server unit and communication system including master-slave management circuitry | Satoshi Tanabe | 2020-10-13 |
| 10725794 | Data processing device, data processing method, setting management device, and data processing system | Naoyuki Kimura | 2020-07-28 |
| 10613960 | Information processing apparatus and information processing method | Takahiko MASUZAKI, Takaaki Nakamura | 2020-04-07 |
| D876466 | Display screen with graphical user interface | Tsuyoshi Kobayashi | 2020-02-25 |
| D872117 | Display screen with graphical user interface | Tsuyoshi Kobayashi | 2020-01-07 |
| 9792688 | Position detection device | Haruhiko TAKEYAMA, Toru Sasaki, Takuya Noguchi, Hajime Nakajima, Yoshinao Tatei +4 more | 2017-10-17 |
| 9605981 | Absolute encoder | Takuya Noguchi, Hajime Nakajima, Haruhiko TAKEYAMA, Toru Sasaki, Makito Seki +5 more | 2017-03-28 |
| 9129775 | Specimen potential measuring method, and charged particle beam device | Tatsuaki Ishijima, Muneyuki Fukuda, Takeyoshi Ohashi, Hiromasa Yamanashi, Takuji Miyamoto +1 more | 2015-09-08 |
| 9000366 | Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns | Atsuko Yamaguchi, Yasunari Sohda, Tatsuya Maeda, Hiroki Kawada | 2015-04-07 |
| 8954496 | Multi-screen display system | Junji Sukeno, Tomonori Fukuta, Masahide KOIKE, Koji Minami | 2015-02-10 |
| 8817869 | Image processing device and method, and image display device and method | Toshiaki Kubo, Yoshiki Ono, Naoyuki Fujiyama, Tomoatsu Horibe | 2014-08-26 |
| 8766182 | Method for detecting information of an electric potential on a sample and charged particle beam apparatus | Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi | 2014-07-01 |
| 8487250 | Method for detecting information of an electronic potential on a sample and charged particle beam apparatus | Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi | 2013-07-16 |
| 8339519 | Image processing apparatus and method and image display apparatus and method | Toshiaki Kubo, Yoshiki Ono, Naoyuki Fujiyama, Tomoatsu Horibe | 2012-12-25 |
| 8304725 | Charged particle beam system | Osamu Komuro | 2012-11-06 |
| 8294118 | Method for adjusting optical axis of charged particle radiation and charged particle radiation device | Akemi Kono | 2012-10-23 |
| 8263934 | Method for detecting information of an electric potential on a sample and charged particle beam apparatus | Minoru Yamazaki, Akira Ikegami, Hideyuki Kazumi | 2012-09-11 |
| 8200006 | Image processing apparatus for analysis of pattern matching failure | Mitsuji Ikeda, Tatsuya Maeda, Fumihiro Sasajima | 2012-06-12 |
| 8080789 | Sample dimension measuring method and scanning electron microscope | Tadashi Otaka, Hiroki Kawada, Ritsuo Fukaya, Makoto Ezumi | 2011-12-20 |
| 8026482 | Charged particle beam apparatus and control method therefor | Muneyuki Fukuda, Hiromasa Yamanashi, Sayaka Tanimoto, Yasunari Souda | 2011-09-27 |
| 7851754 | Charged particle beam system | Osamu Komuro | 2010-12-14 |
| 7714288 | Charged particle beam apparatus | Tasuku Yano, Zhaohui Cheng, Takashi Furukawa | 2010-05-11 |
| 7659508 | Method for measuring dimensions of sample and scanning electron microscope | Tadashi Otaka, Hiroki Kawada, Ritsuo Fukaya, Makoto Ezumi | 2010-02-09 |