WF

Warren M. Farnworth

Micron: 760 patents #3 of 6,345Top 1%
AI Aptina Imaging: 7 patents #36 of 332Top 15%
RR Round Rock Research: 3 patents #66 of 239Top 30%
📍 Nampa, ID: #1 of 306 inventorsTop 1%
🗺 Idaho: #2 of 8,810 inventorsTop 1%
Overall (All Time): #113 of 4,157,543Top 1%
778
Patents All Time

Issued Patents All Time

Showing 251–275 of 778 patents

Patent #TitleCo-InventorsDate
6909929 Stereolithographic method and apparatus for packaging electronic components Mark S. Johnson 2005-06-21
6906418 Semiconductor component having encapsulated, bonded, interconnect contacts William M. Hiatt, Charles M. Watkins, Nishant Sinha 2005-06-14
6903465 Method and apparatus for a semiconductor package for vertical surface mounting Larry D. Kinsman, Walter L. Moden 2005-06-07
6903443 Semiconductor component and interconnect having conductive members and contacts on opposing sides Alan G. Wood, David R. Hembree 2005-06-07
6900459 Apparatus for automatically positioning electronic dice within component packages Alan G. Wood, John O. Jacobson, David R. Hembree, James M. Wark, Jennifer L. Folaron +3 more 2005-05-31
6897089 Method and system for fabricating semiconductor components using wafer level contact printing 2005-05-24
6896837 Layer thickness control for stereolithography utilizing variable liquid elevation and laser focal length 2005-05-24
6893804 Surface smoothing of stereolithographically formed 3-D objects Kevin G. Duesman 2005-05-17
6892453 Method for forming an encapsulation device 2005-05-17
6890844 Methods and apparatus for forming solder balls 2005-05-10
6890801 Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages 2005-05-10
6888159 Substrate mapping Derek Gochnour 2005-05-03
6887787 Method for fabricating semiconductor components with conductors having wire bondable metalization layers 2005-05-03
6884642 Wafer-level testing apparatus and method Steven M. McDonald 2005-04-26
6881607 Underfill and encapsulation of carrier substrate-mounted flip-chip components using stereolithography 2005-04-19
6876089 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer Salman Akram, Alan G. Wood 2005-04-05
6875640 Stereolithographic methods for forming a protective layer on a semiconductor device substrate and substrates including protective layers so formed Alan G. Wood 2005-04-05
6875632 Underfill and encapsulation of carrier substrate-mounted flip-chip components using stereolithography 2005-04-05
6858891 Nanotube semiconductor devices and methods for making the same Kevin G. Duesman 2005-02-22
6857183 Methods of bonding solder balls to bond pads on a substrate, and bonding frames Alan G. Wood 2005-02-22
6853210 Test interconnect having suspended contacts for bumped semiconductor components Salman Akram 2005-02-08
6852999 Reduced terminal testing system Leland R. Nevill, Raymond J. Beffa, Eugene H. Cloud 2005-02-08
6852627 Conductive through wafer vias Nishant Sinha 2005-02-08
6851597 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, Michael E. Hess, John O. Jacobson, Alan G. Wood 2005-02-08
6841883 Multi-dice chip scale semiconductor components and wafer level methods of fabrication Alan G. Wood, William M. Hiatt, James M. Wark, David R. Hembree, Kyle K. Kirby +1 more 2005-01-11