Issued Patents All Time
Showing 25 most recent of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8189423 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Frank F. Ross | 2012-05-29 |
| 7969810 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Scott J. Demer, Ronald Taylor, John S. Mullin +2 more | 2011-06-28 |
| 7885782 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture | — | 2011-02-08 |
| 7875821 | Method for sorting integrated circuit devices | — | 2011-01-25 |
| 7682847 | Method for sorting integrated circuit devices | — | 2010-03-23 |
| 7567091 | Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2009-07-28 |
| 7502659 | Sorting a group of integrated circuit devices for those devices requiring special testing | — | 2009-03-10 |
| 7489564 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Frank F. Ross | 2009-02-10 |
| 7477557 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Frank F. Ross | 2009-01-13 |
| 7477556 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Frank F. Ross | 2009-01-13 |
| 7446277 | Method for sorting integrated circuit devices | — | 2008-11-04 |
| 7368678 | Method for sorting integrated circuit devices | — | 2008-05-06 |
| 7323896 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2008-01-29 |
| 7315179 | System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2008-01-01 |
| 7276926 | Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2007-10-02 |
| 7276672 | Method for sorting integrated circuit devices | — | 2007-10-02 |
| 7276927 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2007-10-02 |
| 7212020 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugen H. Cloud | 2007-05-01 |
| 7124050 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture | — | 2006-10-17 |
| 7117063 | Sorting a group of integrated circuit devices for those devices requiring special testing | — | 2006-10-03 |
| 7107117 | Sorting a group of integrated circuit devices for those devices requiring special testing | — | 2006-09-12 |
| 7034561 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2006-04-25 |
| 6944567 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture | — | 2005-09-13 |
| 6852999 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2005-02-08 |
| 6831475 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2004-12-14 |