RB

Raymond J. Beffa

Micron: 54 patents #326 of 6,345Top 6%
RR Round Rock Research: 2 patents #110 of 239Top 50%
📍 Boise, ID: #174 of 3,546 inventorsTop 5%
🗺 Idaho: #228 of 8,810 inventorsTop 3%
Overall (All Time): #42,080 of 4,157,543Top 2%
58
Patents All Time

Issued Patents All Time

Showing 51–58 of 58 patents

Patent #TitleCo-InventorsDate
6100486 Method for sorting integrated circuit devices 2000-08-08
6067507 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processd during their manufacture 2000-05-23
5994915 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 1999-11-30
5976899 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 1999-11-02
5927512 Method for sorting integrated circuit devices 1999-07-27
5915231 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture 1999-06-22
5898186 Reduced terminal testing system Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud 1999-04-27
5844803 Method of sorting a group of integrated circuit devices for those devices requiring special testing 1998-12-01