Issued Patents All Time
Showing 26–50 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815968 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2004-11-09 |
| 6788993 | Sorting a group of integrated circuit devices for those devices requiring special testing | — | 2004-09-07 |
| 6703573 | Method for sorting integrated circuit devices | — | 2004-03-09 |
| 6636068 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2003-10-21 |
| 6594611 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture | — | 2003-07-15 |
| 6534785 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2003-03-18 |
| 6529793 | Method of sorting a group of integrated circuit devices for those devices requiring special testing | — | 2003-03-04 |
| 6504123 | Process for sorting integrated circuit devices | — | 2003-01-07 |
| 6452415 | Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2002-09-17 |
| 6437271 | Method for sorting integrated circuit devices | — | 2002-08-20 |
| 6424168 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2002-07-23 |
| 6373011 | Method for sorting integrated circuit devices | — | 2002-04-16 |
| 6365860 | Method for sorting integrated circuit devices | — | 2002-04-02 |
| 6365861 | Method for sorting integrated circuit devices | — | 2002-04-02 |
| 6363329 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture | — | 2002-03-26 |
| 6350959 | Method for sorting integrated circuit devices | — | 2002-02-26 |
| 6324088 | 256 meg dynamic random access memory | Brent Keeth, Layne Bunker, Frank F. Ross | 2001-11-27 |
| 6314011 | 256 Meg dynamic random access memory | Brent Keeth, Layne Bunker, Ronald Taylor, John S. Mullin, Frank F. Ross +1 more | 2001-11-06 |
| 6313658 | Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer | Warren M. Farnworth, William K. Waller, Leland R. Nevill, Eugene H. Cloud | 2001-11-06 |
| 6307171 | Method for sorting integrated circuit devices | — | 2001-10-23 |
| 6292009 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2001-09-18 |
| 6208947 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture | — | 2001-03-27 |
| 6147316 | Method for sorting integrated circuit devices | — | 2000-11-14 |
| 6122563 | Method of sorting a group of integrated circuit devices for those devices requiring special testing | — | 2000-09-19 |
| 6118138 | Reduced terminal testing system | Warren M. Farnworth, Leland R. Nevill, Eugene H. Cloud | 2000-09-12 |