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USPTO Patent Rankings Data through Dec 31, 2025
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Michael E. Hess — 36 Patents

Micron: 35 patents #540 of 6,374Top 9%
Kuna, ID: #6 of 87 inventorsTop 7%
Idaho: #401 of 8,810 inventorsTop 5%
Overall (All Time): #92,222 of 4,157,543Top 3%
36 Patents All Time
Michael E. Hess has been granted 36 US patents while listed as an inventor at Micron. The first was granted in 1999 and the most recent in September 2009. Michael E. Hess ranks #92,222 of 4,157,543 US inventors in our database (top 2.2%). Patent records list Michael E. Hess in Kuna, ID, US.

Issued Patents All Time

Showing 1–25 of 36 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
7589010 Semiconductor devices with permanent polymer stencil and method for manufacturing the same Warren M. Farnworth, Alan G. Wood, James M. Wark, David R. Hembree, Syed Sajid Ahmad +1 more 2009-09-15 $6,722,000
7561938 Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICs will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, John O. Jacobson +2 more 2009-07-14 $3,519,000
7387119 Dicing saw with variable indexing capability Salman Akram, Derek Gochnour, David R. Hembree 2008-06-17 $1,834,000
7155300 Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, John O. Jacobson +2 more 2006-12-26 $1,821,000
7120513 Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICS will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, John O. Jacobson +2 more 2006-10-10 $1,925,000
6998334 Semiconductor devices with permanent polymer stencil and method for manufacturing the same Warren M. Farnworth, Alan G. Wood, James M. Wark, David R. Hembree, Syed Sajid Ahmad +1 more 2006-02-14 $2,198,000
6932077 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions and dicing apparatus Salman Akram, Derek Gochnour, David R. Hembree 2005-08-23 $1,384,000
6897571 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2005-05-24 $1,184,000
6851597 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, John O. Jacobson, Warren M. Farnworth, Alan G. Wood 2005-02-08 $1,358,000
6691696 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2004-02-17 $2,708,000
6687990 Sawing method employing multiple indexing techniques and semiconductor device structures fabricated thereby Salman Akram, Derek Gochnour, David R. Hembree 2004-02-10 $2,630,000
6631662 Apparatus for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2003-10-14 $4,453,000
6619532 Methods to utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, John O. Jacobson, Warren M. Farnworth, Alan G. Wood 2003-09-16 $4,026,000
6578458 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2003-06-17 $4,055,000
6553276 Method of using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, John O. Jacobson +2 more 2003-04-22 $2,218,000
6493934 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2002-12-17
6459105 Apparatus for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2002-10-01 $3,166,000
6427676 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2002-08-06 $3,513,000
6427899 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, John O. Jacobson, Warren M. Farnworth, Alan G. Wood 2002-08-06 $3,513,000
6423616 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2002-07-23 $3,822,000
6419143 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems David R. Hembree, John O. Jacobson, Warren M. Farnworth, Alan G. Wood 2002-07-16 $4,820,000
6417685 Test system having alignment member for aligning semiconductor components Salman Akram, Warren M. Farnworth, David R. Hembree 2002-07-09 $4,358,000
6401580 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, David R. Hembree 2002-06-11 $5,486,000
6400174 Test system having alignment member for aligning semiconductor components Salman Akram, Warren M. Farnworth, David R. Hembree 2002-06-04 $5,091,000
6363295 Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, John O. Jacobson +2 more 2002-03-26 $7,434,000