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Home › Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICs will undergo, such as additional repairs

Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICs will undergo, such as additional repairs

US Patent 7561938 · Granted Jul 14, 2009

Estimated economic value: $3,519,000 ⓘ

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