Issued Patents All Time
Showing 26–50 of 109 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11910277 | Multicast-broadcast services configuration exchange for mobility, single-frequency network and interference coordination | Xipeng Zhu, Prasad Reddy Kadiri, Luis Fernando Brisson Lopes | 2024-02-20 |
| 11906770 | Monolithic optical retarder | David Y. Wang | 2024-02-20 |
| 11864015 | Quality of experience measurements for mobility robustness | Rajeev Kumar, Xipeng Zhu, Gavin Bernard Horn | 2024-01-02 |
| 11825553 | UE capability for AI/ML | Xipeng Zhu, Gavin Bernard Horn, Taesang Yoo, Tingfang Ji, Rajeev Kumar +2 more | 2023-11-21 |
| 11818806 | ML model training procedure | Rajeev Kumar, Eren BALEVI, Taesang Yoo, Xipeng Zhu, Gavin Bernard Horn +1 more | 2023-11-14 |
| 11812316 | Handover optimization based on UE mobility prediction | Rajeev Kumar, Xipeng Zhu, Ozcan Ozturk, Linhai HE, Gavin Bernard Horn | 2023-11-07 |
| 11778527 | Reporting for conditional primary secondary cell addition or change | Rajeev Kumar, Punyaslok Purkayastha, Xipeng Zhu, Ozcan Ozturk, Aziz Gholmieh | 2023-10-03 |
| 11729697 | Integrated access and backhaul data collection | Rajeev Kumar, Karl Georg Hampel, Gavin Bernard Horn, Xipeng Zhu | 2023-08-15 |
| 11653243 | Distributed unit (DU) measurement and event reporting in disaggregated base station | Xipeng Zhu, Luis Fernando Brisson Lopes, Rajeev Kumar | 2023-05-16 |
| 11623199 | Solar thermochemical processing system and method | Robert S. Wegeng, Paul H. Humble, Steven Leith, Daniel R. Palo, Robert A. Dagle | 2023-04-11 |
| 11422095 | Scatterometry modeling in the presence of undesired diffraction orders | Phillip Atkins, Liequan Lee, David C. S. Wu, Emily Chiu | 2022-08-23 |
| 11424962 | Model discovery and selection for cooperative machine learning in cellular networks | Rajeev Kumar, Xipeng Zhu, Mutaz Zuhier Afif Shukair, Taesang Yoo | 2022-08-23 |
| 11310687 | Techniques for UE mobility prediction based radio resource management | Rajeev Kumar, Xipeng Zhu, Ozcan Ozturk, Linhai HE, Gavin Bernard Horn | 2022-04-19 |
| 11309202 | Overlay metrology on bonded wafers | David Y. Wang, Johannes D. de Veer | 2022-04-19 |
| 11231362 | Multi-environment polarized infrared reflectometer for semiconductor metrology | Guorong V. Zhuang, David Y. Wang, Xuefeng Liu, Mengmeng Ye, Dawei Hu | 2022-01-25 |
| 11137350 | Mid-infrared spectroscopy for measurement of high aspect ratio structures | David Y. Wang, Guorong V. Zhuang | 2021-10-05 |
| 11119050 | Methods and systems for measurement of thick films and high aspect ratio structures | Noam Sapiens, David Y. Wang, Alexander Buettner, Kerstin Purrucker, Kevin Peterlinz | 2021-09-14 |
| 11077418 | Solar thermochemical processing system and method | Robert S. Wegeng, Paul H. Humble, Steven Leith, Daniel R. Palo, Robert A. Dagle | 2021-08-03 |
| 11056366 | Sample transport device with integrated metrology | Giampietro Bieli, Robert Tas, Kevin O'Brien, Joshua Butler | 2021-07-06 |
| 11043239 | Magneto-optic Kerr effect metrology systems | Jun Wang, Yaolei Zheng, Chunxia Li, Changfei Yan, Lansheng Dong +7 more | 2021-06-22 |
| 10690602 | Methods and systems for measurement of thick films and high aspect ratio structures | Noam Sapiens, David Y. Wang, Alexander Buettner, Kerstin Purrucker, Kevin Peterlinz | 2020-06-23 |
| 10612980 | Temperature sensing based flow monitoring and fault detection | Janusz Jurski, Tozer J. Bandorawalla, Ramkumar Nagappan, Mariusz Oriol, Piotr Sawicki +1 more | 2020-04-07 |
| 10612916 | Measurement of multiple patterning parameters | Andrei V. Shchegrov, Kevin Peterlinz, Thaddeus Gerard Dziura, Noam Sapiens, Stilian Ivanov Pandev | 2020-04-07 |
| 10605722 | Metrology system calibration refinement | Hidong Kwak, John Lesoine, Malik Sadiq, Lanhua Wei, Leonid Poslavsky +1 more | 2020-03-31 |
| 10551166 | Optical measurement of a highly absorbing film layer over highly reflective film stacks | Carlos L. Ygartua | 2020-02-04 |