Issued Patents All Time
Showing 76–100 of 109 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9310290 | Multiple angles of incidence semiconductor metrology systems and methods | David Y. Wang, Klaus Flock, Lawrence D. Rotter, Johannes D. de Veer, Catalin Filip +3 more | 2016-04-12 |
| 9228943 | Dynamically adjustable semiconductor metrology system | David Y. Wang, Guorong V. Zhuang, Johannes D. de Veer, Kevin Peterlinz | 2016-01-05 |
| 9232183 | System and method for providing separate communication zones in a large format videoconference | Svetlana Yarosh | 2016-01-05 |
| 9146156 | Light source tracking in optical metrology system | Guorong V. Zhuang, Johannes D. de Veer, Klaus Flock, David Y. Wang, Lawrence D. Rotter | 2015-09-29 |
| 9116103 | Multiple angles of incidence semiconductor metrology systems and methods | David Y. Wang, Klaus Flock, Lawrence D. Rotter, Johannes D. de Veer, Catalin Filip +3 more | 2015-08-25 |
| 9111336 | Method and apparatus for image filtering | Chao Tian | 2015-08-18 |
| 9076236 | Guided image upsampling using bitmap tracing | James Klosowski | 2015-07-07 |
| 8982179 | Apparatus and method for modification of telecommunication video content | Stephen C. North, John F. Murray, Christopher W. Rice | 2015-03-17 |
| 8963323 | Heat-transfer structure | Roger Scott Kempers, Alan Michael Lyons, Todd Richard Salamon | 2015-02-24 |
| 8949842 | Method and apparatus for locating load-balanced facilities | Aaron Francis Archer | 2015-02-03 |
| 8860937 | Metrology systems and methods for high aspect ratio and large lateral dimension structures | Thaddeus Gerard Dziura, Xuefeng Liu, David Y. Wang, Jonathan M. Madsen, Alexander Kuznetsov +3 more | 2014-10-14 |
| 8797534 | Optical system polarizer calibration | Johannes D. de Veer, Leonid Poslavsky, G. Vera Zhuang | 2014-08-05 |
| 8737735 | System and method of bilateral image filtering | Chao Tian | 2014-05-27 |
| 8570514 | Optical system polarizer calibration | Johannes D. de Veer, Leonid Poslavsky, Guorong V. Zhuang | 2013-10-29 |
| 8571309 | System and method of image upsampling | James Klosowski | 2013-10-29 |
| 8538138 | Global registration of multiple 3D point sets via optimization on a manifold | Pei Yean Lee, John Moore, Suresh Venkatasubramanian | 2013-09-17 |
| 8456639 | Measurement of critical dimension | Haiming Wang | 2013-06-04 |
| 8446584 | Reconfigurable spectroscopic ellipsometer | Haiming Wang | 2013-05-21 |
| 8040511 | Azimuth angle measurement | Haixing Zhou, Haiming Wang, David Lidsky, Walter D. Mieher | 2011-10-18 |
| 7907264 | Measurement of thin film porosity | — | 2011-03-15 |
| 7869040 | Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system | Hidong Kwak, Shing Lee, Haixing Zou | 2011-01-11 |
| 7831090 | Global registration of multiple 3D point sets via optimization on a manifold | Pei Yean Lee, John Moore, Suresh Venkatasubramanian | 2010-11-09 |
| 7825324 | Spreading thermoelectric coolers | Marc Scott Hodes, Christopher D. W. Jones, Oana Malis | 2010-11-02 |
| 7755764 | Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry | Hidong Kwak | 2010-07-13 |
| 7453562 | Ellipsometry measurement and analysis | Torsten R. Kaack, Fabio A. Faccini | 2008-11-18 |