Issued Patents All Time
Showing 101–109 of 109 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7408641 | Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system | Hidong Kwak, Shing Lee, Haixing Zou | 2008-08-05 |
| 7274440 | Systems and methods for measuring stress in a specimen | Gary Janik | 2007-09-25 |
| 7221454 | Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings | D. Scott Hampton, James Rix | 2007-05-22 |
| 7050160 | Process and apparatus for integrating sheet resistance measurements and reflectance measurements of a thin film in a common apparatus | Walter H. Johnson, Jagadish Kalyanam, Murali Narasimhan | 2006-05-23 |
| 7006222 | Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI) | — | 2006-02-28 |
| 6812925 | Map simplification system | Suresh Venkatasubramanian, Nabil Mustafa | 2004-11-02 |
| 6710890 | Substrate thickness determination | Christopher M. Pohlhammer, Michael Green | 2004-03-23 |
| 6052187 | Hyperspectral polarization profiler for remote sensing | Daniel Hampton, Paul C. Nordine | 2000-04-18 |
| 5011295 | Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects | George P. Hansen, Robert H. Hauge, John L. Margrave, Charles A. Rey | 1991-04-30 |