Issued Patents All Time
Showing 51–75 of 109 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10438825 | Spectral reflectometry for in-situ process monitoring and control | Prateek Jain, Daniel Wack, Kevin Peterlinz, Andrei V. Shchegrov | 2019-10-08 |
| 10402941 | Guided image upsampling using bitmap tracing | James Klosowski | 2019-09-03 |
| 10281263 | Critical dimension measurements with gaseous adsorption | — | 2019-05-07 |
| 10215693 | Infrared spectroscopic reflectometer for measurement of high aspect ratio structures | David Y. Wang | 2019-02-26 |
| 10152779 | Method and apparatus for image filtering | Chao Tian | 2018-12-11 |
| 10145674 | Measurement of semiconductor structures with capillary condensation | — | 2018-12-04 |
| 10041873 | Porosity measurement of semiconductor structures | — | 2018-08-07 |
| 9970863 | Optical metrology with reduced focus error sensitivity | Guorong V. Zhuang, David Y. Wang, Xuefeng Liu | 2018-05-15 |
| 9952140 | Small spot size spectroscopic ellipsometer | Haiming Wang | 2018-04-24 |
| 9950305 | Solar thermochemical processing system and method | Robert S. Wegeng, Paul H. Humble, Steven Leith, Daniel R. Palo, Robert A. Dagle | 2018-04-24 |
| 9921152 | Systems and methods for extended infrared spectroscopic ellipsometry | David Y. Wang | 2018-03-20 |
| 9921104 | Simultaneous multi-angle spectroscopy | Alexander Buettner, Kerstin Purrucker, David Y. Wang | 2018-03-20 |
| 9857291 | Metrology system calibration refinement | Hidong Kwak, John Lesoine, Malik Sadiq, Lanhua Wei, Leonid Poslavsky +1 more | 2018-01-02 |
| 9816810 | Measurement of multiple patterning parameters | Andrei V. Shchegrov, Kevin Peterlinz, Thaddeus Gerard Dziura, Noam Sapiens, Stilian Ivanov Pandev | 2017-11-14 |
| 9741096 | Guided image upsampling using bitmap tracing | James Klosowski | 2017-08-22 |
| 9721871 | Heat exchanger methods, apparatuses and systems with a manifold structure | Emery E. Frey, Eric D. McAfee, Juan G. Cevallos, Roger D. Flynn | 2017-08-01 |
| 9514520 | Method and apparatus for image filtering | Chao Tian | 2016-12-06 |
| 9516792 | Ultrasound assisted immersion cooling | Richard C. Stamey, Brian S. Jarrett, Geoffrey G. Von Allmen | 2016-12-06 |
| 9491472 | Guided image upsampling using bitmap tracing | James Klosowski | 2016-11-08 |
| 9490182 | Measurement of multiple patterning parameters | Andrei V. Shchegrov, Kevin Peterlinz, Thaddeus Gerard Dziura, Noam Sapiens, Stilian Ivanov Pandev | 2016-11-08 |
| 9470639 | Optical metrology with reduced sensitivity to grating anomalies | Guorong V. Zhuang, Lanhua Wei, Walter D. Mieher, Paul Aoyagi | 2016-10-18 |
| 9456178 | System and method for providing separate communication zones in a large format videoconference | Svetlana Yarosh | 2016-09-27 |
| 9433132 | Recirculating dielectric fluid cooling | Eric D. McAfee, Tod A. Byquist | 2016-08-30 |
| 9404872 | Selectably configurable multiple mode spectroscopic ellipsometry | Haiming Wang, Guorong V. Zhuang, Klaus Flock, Johannes D. de Veer | 2016-08-02 |
| 9308571 | Heat-transfer structure | Roger Scott Kempers, Alan Michael Lyons, Todd Richard Salamon | 2016-04-12 |