Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605722 | Metrology system calibration refinement | Hidong Kwak, John Lesoine, Lanhua Wei, Shankar Krishnan, Leonid Poslavsky +1 more | 2020-03-31 |
| 9857291 | Metrology system calibration refinement | Hidong Kwak, John Lesoine, Lanhua Wei, Shankar Krishnan, Leonid Poslavsky +1 more | 2018-01-02 |