Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7903250 | Control by sample reflectivity | Torsten R. Kaack, Jiyou Fu, Zhiming Jiang | 2011-03-08 |
| 7453562 | Ellipsometry measurement and analysis | Torsten R. Kaack, Shankar Krishnan | 2008-11-18 |