Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043239 | Magneto-optic Kerr effect metrology systems | Jun Wang, Chunxia Li, Changfei Yan, Lansheng Dong, Yang Zhou +7 more | 2021-06-22 |
| 8804106 | System and method for nondestructively measuring concentration and thickness of doped semiconductor layers | Nanchang Zhu, Derrick Shaughnessy, Houssam Chouaib, Lu Yu, Jianli Cui +2 more | 2014-08-12 |