Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11543431 | Cantilever-type probe with multiple metallic coatings | Hongshuo Zou, Hai-Yang You | 2023-01-03 |
| 11249110 | Resistivity probes with curved portions | Walter H. Johnson, Xianghua Liu, Jianli Cui, Zhu Shi, Zhuoxian Zhang +4 more | 2022-02-15 |
| 10663279 | Dynamic determination of metal film thickness from sheet resistance and TCR value | Xianghua Liu, Walter H. Johnson, Jianli Cui, Lu Yu, Juli Cheng +2 more | 2020-05-26 |
| 10598477 | Dynamic determination of metal film thickness from sheet resistance and TCR value | Xianghua Liu, Walter H. Johnson, Jianli Cui, Lu Yu, Juli Cheng +2 more | 2020-03-24 |
| 10514391 | Resistivity probe having movable needle bodies | Walter H. Johnson, Xianghua Liu, Jianli Cui, Zhu Shi, Zhuoxian Zhang +4 more | 2019-12-24 |
| 10302677 | Multiple pin probes with support for performing parallel measurements | Zhubin Shi | 2019-05-28 |
| 9553034 | Combined semiconductor metrology system | Scott A. Young, Guoheng Zhao, Neeraj Khanna | 2017-01-24 |
| 9435826 | Variable spacing four-point probe pin device and method | Walter H. Johnson, Jianou Shi, Lansheng Dong, Haijing Peng, Xianghua Liu +2 more | 2016-09-06 |
| 9030219 | Variable pressure four-point coated probe pin device and method | Walter H. Johnson | 2015-05-12 |
| 8804106 | System and method for nondestructively measuring concentration and thickness of doped semiconductor layers | Derrick Shaughnessy, Houssam Chouaib, Yaolei Zheng, Lu Yu, Jianli Cui +2 more | 2014-08-12 |
| 8004290 | Method and apparatus for determining dielectric layer properties | Xiafang Zhang, Yiping Feng, Min Xiang, Jianou Shi | 2011-08-23 |
| 7724003 | Substrate conditioning for corona charge control | Jainou Shi, Min Xiang, ZiangHua Liu, Goujun Zhang, Xiafang Zhang +3 more | 2010-05-25 |