Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9239522 | Method of determining an asymmetric property of a structure | Meng-Fu Shih, In-Kyo Kim, Leonid Poslavsky | 2016-01-19 |
| 8004290 | Method and apparatus for determining dielectric layer properties | Nanchang Zhu, Yiping Feng, Min Xiang, Jianou Shi | 2011-08-23 |
| 7724003 | Substrate conditioning for corona charge control | Nanchang Zhu, Jainou Shi, Min Xiang, ZiangHua Liu, Goujun Zhang +3 more | 2010-05-25 |
| 7525304 | Measurement of effective capacitance | Yiping Feng, Jianou Shi | 2009-04-28 |
| 7397254 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Zhiwei Xu, Jianou Shi, Quoc Vu, Thomas G. Miller, Gregory S. Horner | 2008-07-08 |
| 7345306 | Corona based charge voltage measurement | Sergio Edelstein, Eric Bouche, Jianou Shi, Shiyou Pei | 2008-03-18 |
| 7098050 | Corona based charge voltage measurement | Sergio Edelstein, Eric Bouche, Jianou Shi, Shiyou Pei | 2006-08-29 |
| 7075318 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Zhiwei Xu, Jianou Shi, Bao Vu, Thomas G. Miller, Gregory S. Horner | 2006-07-11 |