| 11249110 |
Resistivity probes with curved portions |
Walter H. Johnson, Nanchang Zhu, Xianghua Liu, Zhu Shi, Zhuoxian Zhang +4 more |
2022-02-15 |
| 10663279 |
Dynamic determination of metal film thickness from sheet resistance and TCR value |
Xianghua Liu, Walter H. Johnson, Lu Yu, Nanchang Zhu, Juli Cheng +2 more |
2020-05-26 |
| 10598477 |
Dynamic determination of metal film thickness from sheet resistance and TCR value |
Xianghua Liu, Walter H. Johnson, Lu Yu, Nanchang Zhu, Juli Cheng +2 more |
2020-03-24 |
| 10514391 |
Resistivity probe having movable needle bodies |
Walter H. Johnson, Nanchang Zhu, Xianghua Liu, Zhu Shi, Zhuoxian Zhang +4 more |
2019-12-24 |
| 8804106 |
System and method for nondestructively measuring concentration and thickness of doped semiconductor layers |
Nanchang Zhu, Derrick Shaughnessy, Houssam Chouaib, Yaolei Zheng, Lu Yu +2 more |
2014-08-12 |