Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060982 | Multi-dimensional model of optical dispersion | Natalia Malkova, Mikhail Sushchik, Dawei Hu | 2021-07-13 |
| 10551166 | Optical measurement of a highly absorbing film layer over highly reflective film stacks | Shankar Krishnan | 2020-02-04 |
| 8548748 | Determining thin film stack functional relationships for measurement of chemical composition | — | 2013-10-01 |
| 8111384 | Method for measuring thermo-optically induced material phase-change response in a multiple layer thin film structure using visible and ultraviolet spectroscopy | Lei Zhong, John F. McCormack, Robert J. McClelland | 2012-02-07 |
| 7801713 | Generating a model using global node optimization | Leonid Poslavsky | 2010-09-21 |
| 7321426 | Optical metrology on patterned samples | Leonid Poslavsky | 2008-01-22 |
| 7049844 | Test patterns for optical measurements on multiple binary gratings | — | 2006-05-23 |