Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156548 | Measurement methodology of advanced nanostructures | Manh Dang Nguyen, Phillip Atkins, Alexander Kuznetsov, Liequan Lee, Paul Aoyagi +3 more | 2021-10-26 |
| 11060982 | Multi-dimensional model of optical dispersion | Mikhail Sushchik, Dawei Hu, Carlos L. Ygartua | 2021-07-13 |
| 10770362 | Dispersion model for band gap tracking | Leonid Poslavsky, Ming Di, Qiang Zhao, Dawei Hu | 2020-09-08 |
| 10429296 | Multilayer film metrology using an effective media approximation | Mark A. Neil, Mikhail Sushchik | 2019-10-01 |
| 10410935 | Dispersion model for band gap tracking | Leonid Poslavsky, Ming Di, Qiang Zhao, Dawei Hu | 2019-09-10 |
| 9664734 | Multi-oscillator, continuous Cody-Lorentz model of optical dispersion | Leonid Poslavsky | 2017-05-30 |
| 9595481 | Dispersion model for band gap tracking | Leonid Poslavsky, Ming Di, Qiang Zhao, Dawei Hu | 2017-03-14 |
| 9405290 | Model for optical dispersion of high-K dielectrics including defects | Leonid Poslavsky | 2016-08-02 |