Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12368013 | Thermal cut-off device for high power applications | Changcai ZHAO, Lijuan Huang, Wei Shi, Kangsheng Lin, Guojun Xiao +2 more | 2025-07-22 |
| 12195058 | Auxiliary transportation system for diesel engine monorail crane locomotive in slope and control method | Yunmai Fang, Jing Xie, Liangliang ZHAO, PeiWen Huang | 2025-01-14 |
| 11796390 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Aaron Rosenberg, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen +8 more | 2023-10-24 |
| 11525652 | Preparation method of uniform low stress cone shaped charge liner | Qiang Chen, Dayu SHU, Feng Kang, Shuhai Huang, Wei Zhang +2 more | 2022-12-13 |
| 11519062 | Gradient control method for microstructure ultrafine crystallization of deep cone copper shaped charge liner | Qiang Chen, Dayu SHU, Zude Zhao, Luchang Che, Yang-Cheng Wu +2 more | 2022-12-06 |
| 11378451 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Aaron Rosenberg, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen +8 more | 2022-07-05 |
| 11154840 | Inorganic oxide material | Olivier Larcher, Barry William Luke Southward, Francis Francis, Thomas English, Fabien Ocampo | 2021-10-26 |
| 10770362 | Dispersion model for band gap tracking | Natalia Malkova, Leonid Poslavsky, Ming Di, Dawei Hu | 2020-09-08 |
| 10732520 | Measurement library optimization in semiconductor metrology | Meng Cao, Lie-Quan Lee, Heyin Li, Mengmeng Ye | 2020-08-04 |
| 10678226 | Adaptive numerical aperture control method and system | Qiang Wang, Liequan Lee, Xin Li | 2020-06-09 |
| 10502692 | Automated metrology system selection | Meng Cao, Lie-Quan Lee, Heyin Li, Mengmeng Ye | 2019-12-10 |
| 10458912 | Model based optical measurements of semiconductor structures with anisotropic dielectric permittivity | Houssam Chouaib, Andrei V. Shchegrov, Zhengquan Tan | 2019-10-29 |
| 10410935 | Dispersion model for band gap tracking | Natalia Malkova, Leonid Poslavsky, Ming Di, Dawei Hu | 2019-09-10 |
| 10393647 | System, method, and computer program product for automatically determining a parameter causing an abnormal semiconductor metrology measurement | Liequan Lee, Jonathan Iloreta, Hong Qiu, Leonid Poslavsky | 2019-08-27 |
| 10345721 | Measurement library optimization in semiconductor metrology | Meng Cao, Lie-Quan Lee, Heyin Li, Mengmeng Ye | 2019-07-09 |
| 10239045 | Inorganic composite oxides and methods of making the same | Barry William Luke Southward, Francis Francis, Fabien Ocampo | 2019-03-26 |
| 10079183 | Calculated electrical performance metrics for process monitoring and yield management | Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Ming Di, Scott Penner | 2018-09-18 |
| 10013518 | Model building and analysis engine for combined X-ray and optical metrology | Michael S. Bakeman, Andrei V. Shchegrov, Zhengquan Tan | 2018-07-03 |
| 9595481 | Dispersion model for band gap tracking | Natalia Malkova, Leonid Poslavsky, Ming Di, Dawei Hu | 2017-03-14 |
| 9553033 | Semiconductor device models including re-usable sub-structures | Jonathan Iloreta, Matthew A. Laffin, Leonid Poslavsky, Torsten R. Kaack, Lie-Quan Lee | 2017-01-24 |
| 9442063 | Measurement of composition for thin films | Ming Di, Torsten R. Kaack, Xiang Gao, Leonid Poslavsky | 2016-09-13 |
| 8921007 | Solid oxide fuel cell interconnect cells | Guangyong Lin, Yeshwanth Narendar, John D. Pietras, Robert J. Sliwoski, Caroline Levy +2 more | 2014-12-30 |
| 8912804 | Method for identifying self-generated spurious signals | Christian Volf Olgaard | 2014-12-16 |
| 8711349 | High throughput thin film characterization and defect detection | Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Zhiming Jiang, Jun YE +1 more | 2014-04-29 |
| 8357239 | Treatment of fly ash for use in concrete | Chett Boxley, Akash Akash | 2013-01-22 |