Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099025 | Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection | Lin Zheng, Shitao Dou, Xin Chen, Lunwu ZHANG, Jin Zhang +6 more | 2024-09-24 |
| 11519062 | Gradient control method for microstructure ultrafine crystallization of deep cone copper shaped charge liner | Qiang Chen, Dayu SHU, Qiang Zhao, Zude Zhao, Yang-Cheng Wu +2 more | 2022-12-06 |