MC

Meng Cao

KL Kla-Tencor: 5 patents #301 of 1,394Top 25%
SS St-Ericsson Sa: 2 patents #146 of 771Top 20%
KL Kla: 1 patents #347 of 758Top 50%
NL Nuctech Company Limited: 1 patents #306 of 517Top 60%
NB Nxp B.V.: 1 patents #1,722 of 3,591Top 50%
SC State Grid Corporation Of China: 1 patents #289 of 1,453Top 20%
SP State Grid Tianjin Electric Power: 1 patents #31 of 106Top 30%
Apple: 1 patents #12,251 of 18,612Top 70%
TU Tsinghua University: 1 patents #1,221 of 2,815Top 45%
CL Ceres Intellectual Property Company Limited: 1 patents #31 of 64Top 50%
Overall (All Time): #332,585 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12265066 Imaging method and system for residual stress of basin insulator, and method for preparing test block Jin Chi He, Chun He, Songyuan Li, Qinghua Tang, Chi Zhang +9 more 2025-04-01
11967291 Using content type to select brightness in direct-lit backlight units Mohammad-Reza Tofighi, Pierre-Yves Emelie, Duane M. Petrovich, Shuo Han, Zhendong Hong +4 more 2024-04-23
11901592 SOFC cooling system, fuel cell and hybrid vehicle Longkai Jiang, Youpeng Chen, Weilong Song, Yaxin Du 2024-02-13
10925912 Preparation and application of ginseng derived membranous microparticles Peng Cao, Huaijiang Yan 2021-02-23
10895810 Automatic selection of sample values for optical metrology Leonid Poslavsky, Inkyo Kim, Lie-Quan Lee 2021-01-19
10732520 Measurement library optimization in semiconductor metrology Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye 2020-08-04
10502692 Automated metrology system selection Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye 2019-12-10
10345721 Measurement library optimization in semiconductor metrology Lie-Quan Lee, Qiang Zhao, Heyin Li, Mengmeng Ye 2019-07-09
10190868 Metrology system, method, and computer program product employing automatic transitioning between utilizing a library and utilizing regression for measurement processing Liequan Lee, Raphael Jean Michel Marie Getin, Leonid Poslavsky, Torsten R. Kaack, Hong Qiu 2019-01-29
9412673 Multi-model metrology In-Kyo Kim, Xin Li, Leonid Poslavsky, Liequan Lee, Sungchul Yoo +2 more 2016-08-09
9326743 Multi-energy CT imaging system and imaging method Le Shen, Yuxiang Xing, Qi Shen, Li Zhang, Zhiqiang Chen 2016-05-03
7936230 Non-reciprocal component and method for making and using the component in a mobile terminal Rainer Pietig 2011-05-03
7746188 Integrated non-reciprocal component Rainer Pietig 2010-06-29
7570128 Integrated non-reciprocal component comprising a ferrite substrate Rainer Pietig 2009-08-04