Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11990380 | Methods and systems for combining x-ray metrology data sets to improve parameter estimation | Christopher Liman, Antonio Arion Gellineau, Andrei V. Shchegrov | 2024-05-21 |
| 9412673 | Multi-model metrology | In-Kyo Kim, Xin Li, Leonid Poslavsky, Liequan Lee, Meng Cao +2 more | 2016-08-09 |
| 9311431 | Secondary target design for optical measurements | Andrei V. Shchegrov, Thaddeus Gerard Dziura, Inkyo Kim, Seunghwan Lee, ByeoungSu Hwang +1 more | 2016-04-12 |
| 7349079 | Methods for measurement or analysis of a nitrogen concentration of a specimen | Qiang Zhao, Torsten R. Kaack, Zhengquan Tan | 2008-03-25 |