Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10190868 | Metrology system, method, and computer program product employing automatic transitioning between utilizing a library and utilizing regression for measurement processing | Liequan Lee, Meng Cao, Leonid Poslavsky, Torsten R. Kaack, Hong Qiu | 2019-01-29 |