Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10079183 | Calculated electrical performance metrics for process monitoring and yield management | Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Ming Di, Qiang Zhao | 2018-09-18 |
| 8825444 | Automated system check for metrology unit | Pablo I. Rovira, Jaime Poris, Jonathan M. Madsen | 2014-09-02 |