Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11796390 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen, Stilian Ivanov Pandev +8 more | 2023-10-24 |
| 11573077 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Houssam Chouaib, Kai-Hsiang Lin, Dawei Hu, Zhengquan Tan | 2023-02-07 |
| 11378451 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen, Stilian Ivanov Pandev +8 more | 2022-07-05 |
| 11099137 | Visualization of three-dimensional semiconductor structures | Jonathan Iloreta, Thaddeus Gerard Dziura, Antonio Arion Gellineau, Yin Xu, Kaiwen Xu +5 more | 2021-08-24 |
| 11060846 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Houssam Chouaib, Kai-Hsiang Lin, Dawei Hu, Zhengquan Tan | 2021-07-13 |
| 10794839 | Visualization of three-dimensional semiconductor structures | Jonathan Iloreta, Thaddeus Gerard Dziura, Antonio Arion Gellineau, Yin Xu, Kaiwen Xu +5 more | 2020-10-06 |