Issued Patents All Time
Showing 176–200 of 205 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7602265 | Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems | Hariklia Deligianni, Robert D. Edwards, Thomas J. Fleischman, Robert A. Groves, Charles J. Montrose +1 more | 2009-10-13 |
| 7569475 | Interconnect structure having enhanced electromigration reliability and a method of fabricating same | Chih-Chao Yang, Yun-Yu Wang | 2009-08-04 |
| 7560375 | Gas dielectric structure forming methods | Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra | 2009-07-14 |
| 7545161 | Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes | Louis L. Hsu, Jong-Ru Guo, Zhijian Yang | 2009-06-09 |
| 7533077 | Method, system and program product for automatically creating managed resources | Qinhua Wang, Leigh Williamson | 2009-05-12 |
| 7521952 | Test structure for electromigration analysis and related method | Kaushik Chanda, Ronald G. Filippi | 2009-04-21 |
| 7480649 | Method for efficient evaluation of index screening predicates | You-Chin Fuh, Li Xia, Binghua Zhen | 2009-01-20 |
| 7473636 | Method to improve time dependent dielectric breakdown | Kaushik Chanda, James J. Demarest, Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra +2 more | 2009-01-06 |
| 7453151 | Methods for lateral current carrying capability improvement in semiconductor devices | Natalie B. Feilchenfeld, Zhong-Xiang He, Qizhi Liu, BethAnn Rainey, Kimball M. Watson | 2008-11-18 |
| 7388224 | Structure for determining thermal cycle reliability | Ronald G. Filippi, Jason P. Gill, Vincent J. McGahay, Paul S. McLaughlin, Conal E. Murray +2 more | 2008-06-17 |
| 7375371 | Structure and method for thermally stressing or testing a semiconductor device | Giuseppe La Rosa, Kevin Kolvenbach, John G. Massey, Kai Xiu | 2008-05-20 |
| 7361584 | Detection of residual liner materials after polishing in damascene process | Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra, Stephen K. Loh | 2008-04-22 |
| 7345305 | Control of liner thickness for improving thermal cycle reliability | Ronald G. Filippi, Lynne M. Gignac, Vincent J. McGahay, Conal E. Murray, Hazara S. Rathore +1 more | 2008-03-18 |
| 7287325 | Method of forming interconnect structure or interconnect and via structures using post chemical mechanical polishing | Kaushik Chanda, James J. Demarest, Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra +1 more | 2007-10-30 |
| 7238565 | Methodology for recovery of hot carrier induced degradation in bipolar devices | Fernando Guarin, J. Edwin Hostetter, Stewart E. Rauch, III, Zhijian Yang | 2007-07-03 |
| 7212091 | Micro-electro-mechanical RF switch | Panayotis Andricacos, L. Paivikki Buchwalter, Hariklia Deligianni, Robert A. Groves, Christopher V. Jahnes +4 more | 2007-05-01 |
| 7139749 | Method, system, and program for performance tuning a database query | Patrick D. Bossman, You-Chin Fuh, Chan-Hua Liu, Yun Wang, Jie Zhang | 2006-11-21 |
| 7124414 | Method, system and program product for routing requests in a distributed system | Leigh Williamson | 2006-10-17 |
| 7119545 | Capacitive monitors for detecting metal extrusion during electromigration | Ishtiaq Ahsan, Ronald G. Filippi, Roy Iggulden, Edward W. Kiewra | 2006-10-10 |
| 7098054 | Method and structure for determining thermal cycle reliability | Ronald G. Filippi, Jason P. Gill, Vincent J. McGahay, Paul S. McLaughlin, Conal E. Murray +2 more | 2006-08-29 |
| 6995392 | Test structure for locating electromigration voids in dual damascene interconnects | Paul S. McLaughlin, Timothy D. Sullivan | 2006-02-07 |
| 6989282 | Control of liner thickness for improving thermal cycle reliability | Ronald G. Filippi, Lynne M. Gignac, Vincent J. McGahay, Conal E. Murray, Hazara S. Rathore +1 more | 2006-01-24 |
| 6958621 | Method and circuit for element wearout recovery | Giuseppe La Rosa, Joseph M. Lukaitis, Anastasios A. Katsetos, Stewart E. Rauch, III, Stephen P. Boffoli +2 more | 2005-10-25 |
| 6940285 | Method and apparatus for testing a micro electromechanical device | Charles J. Montrose | 2005-09-06 |
| 6876282 | Micro-electro-mechanical RF switch | Panayotis Andricacos, L. Paivikki Buchwalter, Hariklia Deligianni, Robert A. Groves, Christopher V. Jahnes +4 more | 2005-04-05 |