Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
FG

Fernando Guarin — 10 Patents

IBM: 8 patents #13,181 of 70,183Top 20%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
Millbrook, NY: #12 of 50 inventorsTop 25%
New York: #14,754 of 115,490 inventorsTop 15%
Overall (All Time): #481,000 of 4,157,543Top 15%
10 Patents All Time
Fernando Guarin has been granted 10 US patents while listed as an inventor at IBM. The first was granted in 1996 and the most recent in November 2018. Fernando Guarin ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Fernando Guarin in Millbrook, NY, US.

Patents per Year

Patents granted per year, 1996 to 2018Bar chart with a peak of 2 patents in 2002.peak 21996: 1 patents19961997: 1 patents19972002: 2 patents20022003: 1 patents20032005: 1 patents20052007: 1 patents20072010: 1 patents20102012: 1 patents20122018: 1 patents2018

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10126354 Assessment of HCI in logic circuits based on AC stress in discrete FETs Andreas Kerber, Tanya Nigam 2018-11-13 $39,610,000
8159814 Method of operating transistors and structures thereof for improved reliability and lifetime Ping-Chuan Wang, Zhijian Yang, J. Edwin Hostetter, Kai D. Feng 2012-04-17 $5,847,000
7723824 Methodology for recovery of hot carrier induced degradation in bipolar devices J. Edwin Hostetter, Stewart E. Rauch, III, Ping-Chuan Wang, Zhijian Yang 2010-05-25 $4,007,000
7238565 Methodology for recovery of hot carrier induced degradation in bipolar devices J. Edwin Hostetter, Stewart E. Rauch, III, Ping-Chuan Wang, Zhijian Yang 2007-07-03 $6,885,000
6958621 Method and circuit for element wearout recovery Giuseppe La Rosa, Joseph M. Lukaitis, Anastasios A. Katsetos, Stewart E. Rauch, III, Ping-Chuan Wang +2 more 2005-10-25 $9,634,000
6521469 Line monitoring of negative bias temperature instabilities by hole injection methods Giuseppe La Rosa, Stewart E. Rauch, III 2003-02-18 $14,090,000
6476632 Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring Gluseppe La Rosa, Kevin Kolvenbach, Stewart E. Rauch, III 2002-11-05 $17,812,000
6456104 Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors Anastasios A. Katsetos, Stewart E. Rauch, III 2002-09-24 $8,983,000
5667586 Method for forming a single crystal semiconductor on a substrate Bruce A. Ek, Stephen M. Gates, Subramanian S. Iyer, Adrian Powell 1997-09-16 $12,261,000
5563428 Layered structure of a substrate, a dielectric layer and a single crystal layer Bruce A. Ek, Stephen M. Gates, Subramanian S. Iyer, Adrian Powell 1996-10-08