Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10126354 | Assessment of HCI in logic circuits based on AC stress in discrete FETs | Andreas Kerber, Tanya Nigam | 2018-11-13 |
| 8159814 | Method of operating transistors and structures thereof for improved reliability and lifetime | Ping-Chuan Wang, Zhijian Yang, J. Edwin Hostetter, Kai D. Feng | 2012-04-17 |
| 7723824 | Methodology for recovery of hot carrier induced degradation in bipolar devices | J. Edwin Hostetter, Stewart E. Rauch, III, Ping-Chuan Wang, Zhijian Yang | 2010-05-25 |
| 7238565 | Methodology for recovery of hot carrier induced degradation in bipolar devices | J. Edwin Hostetter, Stewart E. Rauch, III, Ping-Chuan Wang, Zhijian Yang | 2007-07-03 |
| 6958621 | Method and circuit for element wearout recovery | Giuseppe La Rosa, Joseph M. Lukaitis, Anastasios A. Katsetos, Stewart E. Rauch, III, Ping-Chuan Wang +2 more | 2005-10-25 |
| 6521469 | Line monitoring of negative bias temperature instabilities by hole injection methods | Giuseppe La Rosa, Stewart E. Rauch, III | 2003-02-18 |
| 6476632 | Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring | Gluseppe La Rosa, Kevin Kolvenbach, Stewart E. Rauch, III | 2002-11-05 |
| 6456104 | Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors | Anastasios A. Katsetos, Stewart E. Rauch, III | 2002-09-24 |
| 5667586 | Method for forming a single crystal semiconductor on a substrate | Bruce A. Ek, Stephen M. Gates, Subramanian S. Iyer, Adrian Powell | 1997-09-16 |
| 5563428 | Layered structure of a substrate, a dielectric layer and a single crystal layer | Bruce A. Ek, Stephen M. Gates, Subramanian S. Iyer, Adrian Powell | 1996-10-08 |