| 10126354 |
Assessment of HCI in logic circuits based on AC stress in discrete FETs |
Tanya Nigam, Fernando Guarin |
2018-11-13 |
| 10054630 |
Methods, apparatus and system for screening process splits for technology development |
Suresh Uppal, William F. McMahon |
2018-08-21 |
| 9702926 |
Methods, apparatus and system for screening process splits for technology development |
Suresh Uppal, William F. McMahon |
2017-07-11 |
| 9599656 |
Methods, apparatus and system for voltage ramp testing |
Suresh Uppal, William F. McMahon, Eduard A. Cartier |
2017-03-21 |
| 9324822 |
Gate dielectric protection for transistors |
Suresh Uppal, Salvatore Cimino, Hao Jiang |
2016-04-26 |
| 8817570 |
Devices having bias temperature instability compensation |
William F. McMahon, Tanya Nigam |
2014-08-26 |
| 8778750 |
Techniques for the fabrication of thick gate dielectric |
Eduard A. Cartier, Michael P. Chudzik, Siddarth A. Krishnan, Naim Moumen |
2014-07-15 |
| 8610188 |
Integrated circuit decoupling capacitor arrangement |
Tanya Nigam, Dieter Lipp, Marc-Oliver Herden |
2013-12-17 |
| 7880236 |
Semiconductor circuit including a long channel device and a short channel device |
Kingsuk Maitra |
2011-02-01 |
