Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9673115 | Test structures and method of forming an according test structure | Hans-Peter Moll, Stefan Richter | 2017-06-06 |
| 8610188 | Integrated circuit decoupling capacitor arrangement | Andreas Kerber, Tanya Nigam, Marc-Oliver Herden | 2013-12-17 |