Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8855401 | Methods and systems involving measuring complex dimensions of silicon devices | Charles N. Archie, Eric P. Solecky, Georgios A. Vakas | 2014-10-07 |
| 6958621 | Method and circuit for element wearout recovery | Giuseppe La Rosa, Joseph M. Lukaitis, Stewart E. Rauch, III, Ping-Chuan Wang, Stephen P. Boffoli +2 more | 2005-10-25 |
| 6456104 | Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors | Fernando Guarin, Stewart E. Rauch, III | 2002-09-24 |