Issued Patents All Time
Showing 26–47 of 47 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10049904 | Method and system for moving a substrate | Ofer Adan, Israel Avneri, Igor Krivts (Krayvitz), Niranjan Ramchandra Khasgiwale | 2018-08-14 |
| 9997328 | System and method for forming a sealed chamber | Michael R. Rice, Ron Naftali, Natan Schlimoff, Igor Krivts (Krayvitz), Israel Avneri +3 more | 2018-06-12 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Ron Naftali, Ofer Adan, Haim Feldman, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9829809 | System and method for attaching a mask to a mask holder | Israel Avneri, Igor Krivts (Krayvitz), Nir Ben-David Dodzin, Ido Holcman | 2017-11-28 |
| 9666412 | Method for charging and imaging an object | Alon Litman, Benzion Sender | 2017-05-30 |
| 9587749 | Slit valve with a pressurized gas bearing | Michael R. Rice, Natan Schlimoff, Igor Krivts (Krayvitz), Israel Avneri, Erez Admoni +2 more | 2017-03-07 |
| 9302358 | Chamber elements and a method for placing a chamber at a load position | Igor Krayvitz (Krivts), Israel Avneri, Natan Schlimoff, Gilad Schwartz, Yochanan Madmon | 2016-04-05 |
| 9297692 | System and method for inspecting a sample using landing lens | Alon Litman, Ofer Adan, Ron Naftali, Juergen Frosien | 2016-03-29 |
| 9046475 | High electron energy based overlay error measurement methods and systems | Moshe Langer, Ofer Adan, Ram Peltinov, Ori Shoval | 2015-06-02 |
| 8772737 | Conductive element for electrically coupling an EUVL mask to a supporting chuck | Igor Krivts (Krayvitz), Israel Avneri, Nir Ben-David Dodzin, Ido Holcman, Itzak Yair +1 more | 2014-07-08 |
| 7428850 | Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system | Ron Naftali, Ran Vered, Eitan Pinhasi, Igor Krivts (Krayvitz) | 2008-09-30 |
| 6949147 | In situ module for particle removal from solid-state surfaces | David Yogev, Ehud Poles, Amir Wachs | 2005-09-27 |
| 6908567 | Contaminant removal by laser-accelerated fluid | — | 2005-06-21 |
| 6900135 | Buffer station for wafer backside cleaning and inspection | Sasson Somekh, Raphy Adout | 2005-05-31 |
| 6864458 | Iced film substrate cleaning | Amir Widmann, David Yogev | 2005-03-08 |
| 6827816 | In situ module for particle removal from solid-state surfaces | David Yogev, Ehud Poles, Amir Wachs | 2004-12-07 |
| 6764386 | Air bearing-sealed micro-processing chamber | — | 2004-07-20 |
| 6571893 | Light vehicle for sporting and off-road biking | Yoram De-Noor | 2003-06-03 |
| 6566169 | Method and apparatus for local vectorial particle cleaning | Natalie Levinsohn, David Yogev, Yehuda Elisha, Yitzhak Ofer, Lev Fris Man +1 more | 2003-05-20 |
| 6172349 | Autofocusing apparatus and method for high resolution microscope system | Isaac Katz, Michael Faeyrman, Yehuda Elisha, Shimon Kostianovsky, Joel Seligson +1 more | 2001-01-09 |
| 5438413 | Process for measuring overlay misregistration during semiconductor wafer fabrication | Isaac Mazor, Noam Knoll | 1995-08-01 |
| 5030008 | Method and apparatus for the automated analysis of three-dimensional objects | Richard S. F. Scott, Franco Filice | 1991-07-09 |