KV

Kim Vellore

Applied Materials: 18 patents #731 of 7,310Top 10%
SC Sokudo Co.: 1 patents #34 of 74Top 50%
Overall (All Time): #228,316 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12230521 Method for non-contact low substrate temperature measurement Leonid M. Tertitski, Matthew D. Scotney-Castle 2025-02-18
12134835 Quartz susceptor for accurate non-contact temperature measurement 2024-11-05
11756816 Carrier FOUP and a method of placing a carrier Steven Trey Tindel, Alexander Lerner 2023-09-12
11637004 Alignment module with a cleaning chamber Alexander Lerner, Michael P. Karazim, Andrew J. Constant, Jeffrey A. Brodine, Kevin Moraes +1 more 2023-04-25
11538706 System and method for aligning a mask with a substrate Alexander Lerner, Michael P. Karazim, Andrew J. Constant, Jeffrey A. Brodine, Kevin Moraes +1 more 2022-12-27
11469124 Contactless latch and coupling for vacuum wafer transfer cassette Shreyas Patil Shanthaveeraswamy, Ribhu Gautam, Kumaresan Nagarajan, Vijay Singh, Andrew J. Constant +1 more 2022-10-11
11414740 Processing system for forming layers Alexander Lerner, Roey Shaviv, Michael P. Karazim, Kevin Moraes, Steven V. Sansoni +4 more 2022-08-16
11196360 System and method for electrostatically chucking a substrate to a carrier Alexander Lerner, Steven Trey Tindel 2021-12-07
11183411 Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency Alexander Lerner, Steven Trey Tindel 2021-11-23
11047039 Substrate carrier having hard mask Alexander Lerner, Ami Sade, Steven V. Sansoni, Andrew J. Constant, Kevin Moraes +4 more 2021-06-29
10916464 Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency Alexander Lerner, Steven Trey Tindel 2021-02-09
10109514 Visual feedback for process control in RTP chambers Dinesh Kanawade, Stephen Moffatt, Aaron Miller, Leonid M. Tertitski, Norman L. Tam +2 more 2018-10-23
9959610 System and method to detect substrate and/or substrate support misalignment using imaging Leonid M. Tertitski, Schubert S. Chu, Shay Assaf, Zhepeng CONG 2018-05-01
9953851 Process sheet resistance uniformity improvement using multiple melt laser exposures Jiping Li, Aaron Muir Hunter, Bruce E. Adams, Samuel C. Howells, Stephen Moffatt 2018-04-24
9735034 Visual feedback for process control in RTP chambers Dinesh Kanawade, Stephen Moffatt, Aaron Miller, Leonid M. Tertitski, Norman L. Tam +2 more 2017-08-15
9696097 Multi-substrate thermal management apparatus Kallol Bera, Andrew J. Constant, Jacob Newman, Jeffrey Blahnik, Jason M. Schaller +3 more 2017-07-04
9390926 Process sheet resistance uniformity improvement using multiple melt laser exposures Jiping Li, Aaron Muir Hunter, Bruce E. Adams, Samuel C. Howells, Stephen Moffatt 2016-07-12
7567885 Method and system for determining object height Harald Herchen, Erica Porras 2009-07-28
6598559 Temperature controlled chamber Qiwei Liang, Erwin Polar 2003-07-29