MG

Mark I. Gardner

AM AMD: 507 patents #1 of 9,279Top 1%
TL Tokyo Electron Limited: 92 patents #12 of 5,567Top 1%
AP Advanced Microdevices Pvt: 2 patents #1 of 26Top 4%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
📍 Prairieville, TX: #1 of 6 inventorsTop 20%
🗺 Texas: #2 of 125,132 inventorsTop 1%
Overall (All Time): #244 of 4,157,543Top 1%
608
Patents All Time

Issued Patents All Time

Showing 351–375 of 608 patents

Patent #TitleCo-InventorsDate
6049133 Semiconductor fabrication employing concurrent diffusion barrier and salicide formation Fred N. Hause 2000-04-11
6048803 Method of fabricating a semiconductor device having fluorine bearing oxide between conductive lines Daniel Kadosh 2000-04-11
6048766 Flash memory device having high permittivity stacked dielectric and fabrication thereof Mark C. Gilmer, Thomas E. Spikes, Jr. 2000-04-11
6048785 Semiconductor fabrication method of combining a plurality of fields defined by a reticle image using segment stitching H. Jim Fulford, Robert Dawson, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-04-11
6046089 Selectively sized spacers Fred N. Hause, Charles E. May 2000-04-04
6046471 Ultra shallow junction depth transistors Fred N. Hause, Daniel Kadosh 2000-04-04
6043533 Method of integrating Ldd implantation for CMOS device fabrication Fred N. Hause, Robert Paiz 2000-03-28
6043157 Semiconductor device having dual gate electrode material and process of fabrication thereof Mark C. Gilmer 2000-03-28
6040602 Formation of lightly doped regions under a gate H. James Fulford 2000-03-21
6040207 Oxide formation technique using thin film silicon deposition Mark C. Gilmer 2000-03-21
6040607 Self aligned method for differential oxidation rate at shallow trench isolation edge Derick J. Wristers, H. Jim Fulford 2000-03-21
6040220 Asymmetrical transistor formed from a gate conductor of unequal thickness Daniel Kadosh, Michael Duane 2000-03-21
6037629 Trench transistor and isolation trench Daniel Kadosh, Jon D. Cheek 2000-03-14
6037244 Method of manufacturing a semiconductor device using advanced contact formation Thomas E. Spikes, Jr., Robert Paiz, Frederick N. Hause, Sey-Ping Sun 2000-03-14
6033943 Dual gate oxide thickness integrated circuit and process for making same 2000-03-07
6030860 Elevated substrate formation and local interconnect integrated fabrication Daniel Kadosh, Michael Duane 2000-02-29
6030752 Method of stitching segments defined by adjacent image patterns during the manufacture of a semiconductor device H. Jim Fulford, Robert Dawson, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-02-29
6027992 Semiconductor device having a gallium and nitrogen containing barrier layer and method of manufacturing thereof Mark C. Gilmer 2000-02-22
6027978 Method of making an IGFET with a non-uniform lateral doping profile in the channel region Michael Duane, Daniel Kadosh 2000-02-22
6027976 Process for making semiconductor device having nitride at silicon and polysilicon interfaces Mark C. Gilmer 2000-02-22
6027964 Method of making an IGFET with a selectively doped gate in combination with a protected resistor Daniel Kadosh, Michael Duane 2000-02-22
6025633 Multi-level transistor fabrication method having an inverted, upper level transistor which shares a gate conductor with a non-inverted, lower level transistor Daniel Kadosh 2000-02-15
6025238 Semiconductor device having an nitrogen-rich punchthrough region and fabrication thereof 2000-02-15
6020232 Process of fabricating transistors having source and drain regions laterally displaced from the transistors gate H. Jim Fulford 2000-02-01
6020260 Method of fabricating a semiconductor device having nitrogen-bearing gate electrode 2000-02-01