MG

Mark I. Gardner

AM AMD: 507 patents #1 of 9,279Top 1%
TL Tokyo Electron Limited: 92 patents #12 of 5,567Top 1%
AP Advanced Microdevices Pvt: 2 patents #1 of 26Top 4%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
📍 Prairieville, TX: #1 of 6 inventorsTop 20%
🗺 Texas: #2 of 125,132 inventorsTop 1%
Overall (All Time): #244 of 4,157,543Top 1%
608
Patents All Time

Issued Patents All Time

Showing 301–325 of 608 patents

Patent #TitleCo-InventorsDate
6090676 Process for making high performance MOSFET with scaled gate electrode thickness H. Jim Fulford, Charles E. May 2000-07-18
6090694 Local interconnect patterning and contact formation Fred N. Hause, Charles E. May 2000-07-18
6091105 Method of making a self-aligned dopant enhanced RTA MOSFET H. Jim Fulford 2000-07-18
6086976 Semiconductor wafer, handling apparatus, and method Mark C. Gilmer 2000-07-11
6087706 Compact transistor structure with adjacent trench isolation and source/drain regions implanted vertically into trench walls Robert Dawson, Frederick N. Hause, H. Jim Fulford, Mark W. Michael, Bradley T. Moore +1 more 2000-07-11
6087705 Trench isolation structure partially bound between a pair of low K dielectric structures H. Jim Fulford, Charles E. May 2000-07-11
6087249 Transistor fabrication process employing a common chamber for gate oxide and gate conductor formation Fred N. Hause 2000-07-11
6087238 Semiconductor device having reduced-width polysilicon gate and non-oxidizing barrier layer and method of manufacture thereof H. Jim Fulford 2000-07-11
6084280 Transistor having a metal silicide self-aligned to the gate Frederick N. Hause, Charles E. May 2000-07-04
6083778 Localized semiconductor substrate for multilevel for transistors Daniel Kadosh 2000-07-04
6083846 Graded MOS transistor junction formed by aligning a sequence of implants to a selectively removable polysilicon sidewall space and oxide thermally grown thereon H. Jim Fulford, Fred N. Hause 2000-07-04
6080629 Ion implantation into a gate electrode layer using an implant profile displacement layer Robert Dawson, H. Jim Fulford, Frederick N. Hause, Mark W. Michael, Bradley T. Moore +1 more 2000-06-27
6080640 Metal attachment method and structure for attaching substrates at low temperatures Fred N. Hause, Daniel Kadosh 2000-06-27
6080676 Device and method for etching spacers formed upon an integrated circuit gate conductor Thien T. Nguyen, Charles E. May 2000-06-27
6078080 Asymmetrical transistor with lightly and heavily doped drain regions and ultra-heavily doped source region Daniel Kadosh, Robert Dawson 2000-06-20
6078078 V-gate transistor H. Jim Fulford, Charles E. May 2000-06-20
6078089 Semiconductor device having cobalt niobate-metal silicide electrode structure and process of fabrication thereof Mark C. Gilmer 2000-06-20
6077749 Method of making dual channel gate oxide thickness for MOSFET transistor design H. Jim Fulford, Charles E. May 2000-06-20
6077748 Advanced trench isolation fabrication scheme for precision polysilicon gate control Daniel Kadosh, Michael Duane 2000-06-20
6075268 Ultra high density inverter using a stacked transistor arrangement Daniel Kadosh 2000-06-13
6074904 Method and structure for isolating semiconductor devices after transistor formation Thomas E. Spikes, Jr., Mark W. Michael, Robert Dawson 2000-06-13
6074919 Method of forming an ultrathin gate dielectric Thien T. Nguyen 2000-06-13
6075258 Elevated transistor fabrication technique Daniel Kadosh, Michael Duane 2000-06-13
6072192 Test structure responsive to electrical signals for determining lithographic misalignment of vias relative to electrically active elements H. Jim Fulford, Fred N. Hause 2000-06-06
6072213 Transistor having an etchant-scalable channel length and method of making same Mark C. Gilmer 2000-06-06