| 12068257 |
Integrated circuit (IC) structure protection scheme |
Myongseob Kim, Yun Wu, Cheang-Whang Chang |
2024-08-20 |
| 11901338 |
Interwafer connection structure for coupling wafers in a wafer stack |
Myongseob Kim, Cheang-Whang Chang |
2024-02-13 |
| 11355412 |
Stacked silicon package assembly having thermal management |
Jaspreet S. Gandhi, Gamal Refai-Ahmed, Myongseob Kim, Tien-Yu Lee, Suresh Ramalingam +1 more |
2022-06-07 |
| 11205639 |
Integrated circuit device with stacked dies having mirrored circuitry |
Myongseob Kim, Cheang-Whang Chang |
2021-12-21 |
| 11114344 |
IC die with dummy structures |
Hui-Wen Lin, Nui Chong, Myongseob Kim, Ping-Chin Yeh, Cheang-Whang Chang |
2021-09-07 |
| 11054461 |
Test circuits for testing a die stack |
Nui Chong, Amitava Majumdar, Cheang-Whang Chang, Myongseob Kim, Albert Shih-Huai Lin |
2021-07-06 |
| 10971474 |
Package integration for high bandwidth memory |
Jaspreet S. Gandhi |
2021-04-06 |
| 10770430 |
Package integration for memory devices |
Myongseob Kim, Cheang-Whang Chang, Jaspreet S. Gandhi |
2020-09-08 |
| 10720377 |
Electronic device apparatus with multiple thermally conductive paths for heat dissipation |
Gamal Refai-Ahmed, Ho Hyung Lee, Hui-Wen Lin, Suresh Ramalingam |
2020-07-21 |
| 10692837 |
Chip package assembly with modular core dice |
Myongseob Kim, Cheang-Whang Chang, Nui Chong |
2020-06-23 |
| 10629512 |
Integrated circuit die with in-chip heat sink |
Hong-Tsz Pan, Jonathan Chang, Nui Chong, Gamal Refai-Ahmed, Suresh Ramalingam |
2020-04-21 |
| 10593638 |
Methods of interconnect for high density 2.5D and 3D integration |
Jaspreet S. Gandhi, Suresh Ramalingam |
2020-03-17 |
| 10529645 |
Methods and apparatus for thermal interface material (TIM) bond line thickness (BLT) reduction and TIM adhesion enhancement for efficient thermal management |
Jaspreet S. Gandhi, Tien-Yu Lee, Gamal Refai-Ahmed, Myongseob Kim, Ferdinand F. Fernandez +2 more |
2020-01-07 |
| 10527670 |
Testing system for lid-less integrated circuit packages |
Gamal Refai-Ahmed, Ivor G. Barber, Suresh Ramalingam, Jaspreet S. Gandhi, Tien-Yu Lee +2 more |
2020-01-07 |
| 10431565 |
Wafer edge partial die engineered for stacked die yield |
Myongseob Kim, Cheang-Whang Chang |
2019-10-01 |
| 10319606 |
Chip package assembly with enhanced interconnects and method for fabricating the same |
Jaspreet S. Gandhi, Tien-Yu Lee, Ivor G. Barber, Suresh Ramalingam |
2019-06-11 |
| 10262911 |
Circuit for and method of testing bond connections between a first die and a second die |
Yuqing Gong, Myongseob Kim, Suresh Parameswaran, Cheang-Whang Chang, Boon Yong Ang |
2019-04-16 |
| 9412674 |
Shielded wire arrangement for die testing |
Myongseob Kim, Cheang-Whang Chang, Sanjiv Stokes |
2016-08-09 |
| 9337138 |
Capacitors within an interposer coupled to supply and ground planes of a substrate |
Khaldoon S. Abugharbieh, Gregory Meredith, Christopher P. Wyland, Paul Ying-Fung Wu, Sanjiv Stokes +1 more |
2016-05-10 |
| 8810269 |
Method of testing a semiconductor structure |
Yuqing Gong, Myongseob Kim, Suresh Parameswaran, Cheang-Whang Chang, Boon Yong Ang |
2014-08-19 |
| 8802454 |
Methods of manufacturing a semiconductor structure |
Arifur Rahman, Cheang-Whang Chang, Myongseob Kim, Dong Wook Kim |
2014-08-12 |
| 8354671 |
Integrated circuit with adaptive VGG setting |
Hsung Jai Im, Jae-Gyung Ahn, Tony Le, Patrick J. Crotty |
2013-01-15 |