Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11818982 | Grain quality control system and method | Stephen R. Corban, Scott E. Miller, William D. Todd, Herman Herman, Zachary Abraham Pezzementi +1 more | 2023-11-21 | $58,141,000 |
| 11197417 | Grain quality control system and method | Stephen R. Corban, Scott E. Miller, Herman Herman, Zachary Abraham Pezzementi, Trenton Tabor | 2021-12-14 | $220,282,000 |
| 10629512 | Integrated circuit die with in-chip heat sink | Hong-Tsz Pan, Nui Chong, Henley Liu, Gamal Refai-Ahmed, Suresh Ramalingam | 2020-04-21 | $30,775,000 |
| 7635843 | In-line reliability test using E-beam scan | Yuhao Luo | 2009-12-22 | $4,374,000 |
| 7091077 | Method of directionally trimming polysilicon width | David Kuan-Yu Liu | 2006-08-15 | $5,442,000 |
| 6580072 | Method for performing failure analysis on copper metallization | Brian J. Wollard | 2003-06-17 | $62,564,000 |