| 11488887 |
Thermal enablement of dies with impurity gettering |
Gamal Refai-Ahmed, Suresh Ramalingam, Toshiyuki Hisamura, Suresh Parameswaran, Scott McCann +1 more |
2022-11-01 |
|
| 11379580 |
Mixed storage of data fields |
James D. Wesselkamper, Edward S. Peterson, Jason J. Moore, Steven E. McNeil, Roger D. Flateau, Jr. +1 more |
2022-07-05 |
|
| 11073550 |
Test vehicle for package testing |
Yuqing Gong, Suresh Parameswaran |
2021-07-27 |
$80,530,000 |
| 10620644 |
Systems and methods for on-die heat generation and temperature sensing |
Suresh Parameswaran, Sarayanan Balakrishnan |
2020-04-14 |
$21,268,000 |
| 10302504 |
On-die temperature sensing and digitization system |
Suresh Parameswaran, Ankur Jain |
2019-05-28 |
$41,882,000 |
| 10262911 |
Circuit for and method of testing bond connections between a first die and a second die |
Yuqing Gong, Henley Liu, Myongseob Kim, Suresh Parameswaran, Cheang-Whang Chang |
2019-04-16 |
$53,960,000 |
| 8810269 |
Method of testing a semiconductor structure |
Yuqing Gong, Henley Liu, Myongseob Kim, Suresh Parameswaran, Cheang-Whang Chang |
2014-08-19 |
$15,329,000 |
| 8564023 |
Integrated circuit with MOSFET fuse element |
Hsung Jai Im, Sunhom Paak |
2013-10-22 |
$21,521,000 |
| 8143695 |
Contact fuse one time programmable memory |
Serhii Tumakha, Amit Ghia |
2012-03-27 |
$2,711,000 |
| 8102019 |
Electrically programmable diffusion fuse |
Serhii Tumakha, Amit Ghia, Jan Lodewijk de Jong |
2012-01-24 |
$8,017,000 |
| 7923785 |
Field effect transistor having increased carrier mobility |
Qi Xiang, Jung-Suk Goo |
2011-04-12 |
$5,867,000 |
| 7923811 |
Electronic fuse cell with enhanced thermal gradient |
Hsung Jai Im, Sunhom Paak |
2011-04-12 |
$10,435,000 |
| 7839693 |
Method of fabricating CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer |
Sunhom Paak, Hsung Jai Im, Daniel Gitlin |
2010-11-23 |
$3,199,000 |
| 7834659 |
Multi-step programming of E fuse cells |
Hsung Jai Im, Sunhom Paak |
2010-11-16 |
$18,992,000 |
| 7724600 |
Electronic fuse programming current generator with on-chip reference |
Hsung Jai Im, Sunhom Paak |
2010-05-25 |
$2,818,000 |
| 7710813 |
Electronic fuse array |
Hsung Jai Im, Sunhom Paak, Raymond C. Pang, Serhii Tumakha |
2010-05-04 |
$10,365,000 |
| 7688639 |
CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer |
Sunhom Paak, Hsung Jai Im, Daniel Gitlin |
2010-03-30 |
$14,323,000 |
| 7598749 |
Integrated circuit with fuse programming damage detection |
Sunhom Paak, Hsung Jai Im, Kwansuhk Oh, Raymond C. Pang |
2009-10-06 |
$6,100,000 |
| 7567449 |
One-time-programmable logic bit with multiple logic elements |
Sunhom Paak, Hsung Jai Im |
2009-07-28 |
$9,789,000 |
| 7381620 |
Oxygen elimination for device processing |
Hidehiko Shiraiwa, Simon S. Chan, Harpreet Sachar, Mark Randolph |
2008-06-03 |
$3,474,000 |
| 7312625 |
Test circuit and method of use thereof for the manufacture of integrated circuits |
Sunhom Paak, Hsung Jai Im, Jan Lodewijk de Jong |
2007-12-25 |
|
| 7294888 |
CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer |
Sunhom Paak, Hsung Jai Im, Daniel Gitlin |
2007-11-13 |
$8,685,000 |
| 7242102 |
Bond pad structure for copper metallization having increased reliability and method for fabricating same |
Inkuk Kang, Hiroyuki Kinoshita, Hajime Wada, Simon S. Chan, Cinti X. Chen |
2007-07-10 |
$13,776,000 |
| 7122465 |
Method for achieving increased control over interconnect line thickness across a wafer and between wafers |
Cinti X. Chen, Simon S. Chan, Inkuk Kang |
2006-10-17 |
$15,100,000 |
| 6995564 |
Method and system for locating chip-level defects through emission imaging of a semiconductor device |
Mehrdad Mahanpour, Mohammed Massoodi |
2006-02-07 |
$12,481,000 |
