Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
AP

Axel Preusse — 30 Patents

AMD: 22 patents #499 of 9,280Top 6%
Globalfoundries: 8 patents #444 of 4,424Top 15%
Overall (All Time): #121,623 of 4,157,543Top 3%
30 Patents All Time
Axel Preusse has been granted 30 US patents while listed as an inventor at AMD. The first was granted in 2000 and the most recent in April 2017. Axel Preusse ranks #121,623 of 4,157,543 US inventors in our database (top 2.9%). Patent records list Axel Preusse in Radebeul, CA, DE.

Issued Patents All Time

Showing 1–25 of 30 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
9620453 Semiconductor structure including a layer of a first metal between a diffusion barrier layer and a second metal and method for the formation thereof Romy Liske, Marcus Wislicenus, Robert F. Krause, Lukas Gerlich, Benjamin Uhlig +1 more 2017-04-11 $14,156,000
9305878 Integrated circuits and methods for fabricating integrated circuits with capping layers between metal contacts and interconnects Torsten Huisinga, Carsten Peters, Andreas Ott 2016-04-05 $1,295,000
8951900 Contact elements of a semiconductor device formed by electroless plating and excess material removal with reduced sheer forces Norbert Schroeder, Uwe Stoeckgen 2015-02-10 $2,183,000
8932911 Integrated circuits and methods for fabricating integrated circuits with capping layers between metal contacts and interconnects Torsten Huisinga, Carsten Peters, Andreas Ott 2015-01-13 $1,493,000
8883610 Microstructure device including a metallization structure with self-aligned air gaps between closely spaced metal lines Robert Seidel, Markus Nopper 2014-11-11 $1,428,000
8450197 Contact elements of a semiconductor device formed by electroless plating and excess material removal with reduced sheer forces Norbert Schroeder, Uwe Stoeckgen 2013-05-28 $3,942,000
8389401 Contact elements of semiconductor devices formed on the basis of a partially applied activation layer Robert Seidel, Markus Nopper 2013-03-05 $2,179,000
8314494 Metal cap layer of increased electrode potential for copper-based metal regions in semiconductor devices Markus Nopper, Robert Seidel 2012-11-20 $2,815,000
8153524 Providing superior electromigration performance and reducing deterioration of sensitive low-k dielectrics in metallization systems of semiconductor devices Oliver Aubel, Joerg Hohage, Frank Feustel 2012-04-10 $5,913,000
7985329 Technique for electrochemically depositing an alloy having a chemical order Gerd Marxsen 2011-07-26 $4,784,000
7981793 Method of forming a metal directly on a conductive barrier layer by electrochemical deposition using an oxygen-depleted ambient Charlotte Emnet, Susanne Wehner 2011-07-19 $3,440,000
7947158 Apparatus and method for removing bubbles from a process liquid Helge Hartz, Markus Nopper 2011-05-24 $15,194,000
7781329 Reducing leakage in dielectric materials including metal regions including a metal cap layer in semiconductor devices Markus Nopper, Thomas Ortleb, Juergen Boemmels 2010-08-24 $5,281,000
7745327 Method of forming a copper-based metallization layer including a conductive cap layer by an advanced integration regime Michael Friedemann, Robert Seidel, Berit Freudenberg 2010-06-29 $10,708,000
7615103 Apparatus and method for removing bubbles from a process liquid Helge Hartz, Markus Nopper 2009-11-10 $22,613,000
7560381 Technique for metal deposition by electroless plating using an activation scheme including a substrate heating process Markus Nopper, Matthias Bonkass 2009-07-14 $9,035,000
7517782 Method of forming a metal layer over a patterned dielectric by wet chemical deposition including an electroless and a powered phase Susanne Wehner, Markus Nopper 2009-04-14 $5,338,000
7476552 Method of reworking a semiconductor structure Uwe Stoeckgen, Markus Nopper 2009-01-13 $12,331,000
7375031 Technique for forming interconnect structures with reduced electro and stress migration and/or resistivity Markus Keil, Wolfgang Buchholtz, Petra Hetzer, Elvira Buchholtz 2008-05-20 $11,194,000
7169664 Method of reducing wafer contamination by removing under-metal layers at the wafer edge Markus Nopper, Holger Schührer 2007-01-30 $15,947,000
6974530 Method and system for controlling ion distribution during plating of a metal on a workpiece surface Matthias Bonkass 2005-12-13 $8,414,000
6958247 Method of electroplating copper over a patterned dielectric layer to enhance process uniformity of a subsequent CMP process Gerd Marxsen, Markus Nopper, Frank Mauersberger 2005-10-25 $11,546,000
6951816 Method of forming a metal layer over patterned dielectric by electroless deposition using a catalyst Markus Nopper 2005-10-04 $16,745,000
6841056 Apparatus and method for treating a substrate electrochemically while reducing metal corrosion 2005-01-11 $4,696,000
6774030 Method and system for improving the manufacturing of metal damascene structures Gerd Marxsen 2004-08-10 $1,968,000