SP

Soonam Park

Applied Materials: 12 patents #14 of 1,241Top 2%
Overall (2019): #5,717 of 560,194Top 2%
12
Patents 2019

Issued Patents 2019

Patent #TitleCo-InventorsDate
10522371 Systems and methods for improved semiconductor etching and component protection Tien Fak Tan, Lok Kee Loh, Dmitry Lubomirsky, Soonwook Jung, Martin Yue Choy 2019-12-31
10504754 Systems and methods for improved semiconductor etching and component protection Tien Fak Tan, Lok Kee Loh, Dmitry Lubomirsky, Soonwook Jung, Martin Yue Choy 2019-12-10
10504700 Plasma etching systems and methods with secondary plasma injection Toan Q. Tran, Zilu Weng, Dmitry Lubomirsky 2019-12-10
10504697 Particle generation suppresor by DC bias modulation Jonghoon Baek, Xinglong Chen, Dmitry Lubomirsky 2019-12-10
10490418 Systems and methods for internal surface conditioning assessment in plasma processing equipment Yufei Zhu, Edwin C. Suarez, Nitin K. Ingle, Dmitry Lubomirsky, Jiayin Huang 2019-11-26
10468285 High temperature chuck for plasma processing systems Toan Q. Tran, Sultan Malik, Dmitry Lubomirsky, Shambhu N. Roy, Satoru Kobayashi +2 more 2019-11-05
10460915 Rotatable substrate support having radio frequency applicator Satoru Kobayashi, Kirby H. Floyd, Hiroji Hanawa, Dmitry Lubomirsky 2019-10-29
10453655 Plasma reactor having digital control over rotation frequency of a microwave field with direct up-conversion Satoru Kobayashi, Hideo Sugai, Kartik Ramaswamy, Dmitry Lubomirsky 2019-10-22
10431429 Systems and methods for radial and azimuthal control of plasma uniformity Satoru Kobayashi, Hideo Sugai, Nikolai Kalnin, Toan Q. Tran, Dmitry Lubomirsky 2019-10-01
10354843 Chemical control features in wafer process equipment Qiwei Liang, Xinglong Chen, Kien N. Chuc, Dmitry Lubomirsky, Jang-Gyoo Yang +4 more 2019-07-16
10340124 Generalized cylindrical cavity system for microwave rotation and impedance shifting by irises in a power-supplying waveguide Satoru Kobayashi, Hideo Sugai, Toan Q. Tran, Dmitry Lubomirsky 2019-07-02
10319649 Optical emission spectroscopy (OES) for remote plasma monitoring Tae Seung Cho, Junghoon Kim, Dmitry Lubomirsky, Shankar Venkataraman 2019-06-11