WC

Weng Chang

TSMC: 93 patents #292 of 12,232Top 3%
RJ Rutgers, The State University Of New Jersey: 1 patents #651 of 1,498Top 45%
📍 Hsinchu, NJ: #2 of 42 inventorsTop 5%
Overall (All Time): #16,060 of 4,157,543Top 1%
95
Patents All Time

Issued Patents All Time

Showing 51–75 of 95 patents

Patent #TitleCo-InventorsDate
10504795 Method for patterning a lanthanum containing layer Kun-Yu Lee, Huicheng Chang, Che-Hao Chang, Ching-Hwanq Su, Xiong-Fei Yu 2019-12-10
10483170 Method of semiconductor integrated circuit fabrication De-Wei Yu, Chia Ping Lo, Liang-Gi Yao, Yee-Chia Yeo, Ziwei Fang 2019-11-19
10304835 Semiconductor device and method Cheng-Yen Tsai, Ming-Chi Huang, Zoe Chen, Wei-Chin Lee, Cheng-Lung Hung +2 more 2019-05-28
10297453 Pre-deposition treatment and atomic layer deposition (ALD) process and structures formed thereby Cheng-Yen Tsai, Da-Yuan Lee, JoJo Lee, Ming-Hsing Tsai, Hsueh Wen Tsau +2 more 2019-05-21
10014382 Semiconductor device with sidewall passivation and method of making Mrunal A. Khaderbad, Hsueh Wen Tsau, Chia-Ching Lee, Da-Yuan Lee, Hsiao-Kuan Wei +2 more 2018-07-03
10008418 Method of semiconductor integrated circuit fabrication De-Wei Yu, Chia Ping Lo, Liang-Gi Yao, Yee-Chia Yeo, Ziwei Fang 2018-06-26
9978601 Methods for pre-deposition treatment of a work-function metal layer Cheng-Yen Tsai, Hsin-Yi Lee, Chung-Chiang Wu, Da-Yuan Lee, Ming-Hsing Tsai 2018-05-22
9947540 Pre-deposition treatment and atomic layer deposition (ALD) process and structures formed thereby Cheng-Yen Tsai, Da-Yuan Lee, JoJo Lee, Ming-Hsing Tsai, Hsueh Wen Tsau +2 more 2018-04-17
9761683 Semiconductor device and manufacturing method thereof Chun-Yuan Chou, Chung-Chiang Wu, Da-Yuan Lee 2017-09-12
9590065 Semiconductor device with metal gate structure comprising work-function metal layer and work-fuction adjustment layer Da-Yuan Lee, Kuan-Ting Liu, Hung-Chin Chung, Hsien-Ming Lee, Syun-Ming Jang +1 more 2017-03-07
9293334 N metal for FinFET and methods of forming Po-Chin Kuo, Chung-Liang Cheng, Hsien-Ming Lee 2016-03-22
9064857 N metal for FinFET Po-Chin Kuo, Chung-Liang Cheng, Hsien-Ming Lee 2015-06-23
8846461 Silicon layer for stopping dislocation propagation Hsien-Hsin Lin, Chien-Chang Su, Kuan-Yu Chen, Hsueh-Chang Sung, Ming-Hua Yu 2014-09-30
8344447 Silicon layer for stopping dislocation propagation Hsien-Hsin Lin, Chien-Chang Su, Kuan-Yu Chen, Hsueh-Chang Sung, Ming-Hua Yu 2013-01-01
8258588 Sealing layer of a field effect transistor Yu-Chao Lin, Jr-Jung Lin, Yih-Ann Lin, Jih-Jse Lin, Chao-Cheng Chen +1 more 2012-09-04
7834389 Triangular space element for semiconductor device Yu-Lien Huang, Yi-Chen Huang, Jim Huang, Hun-Jan Tao 2010-11-16
7375040 Etch stop layer Simon Su-Horng Lin, Syun-Ming Jang, Mong-Song Liang 2008-05-20
7253524 Copper interconnects Zhen-Cheng Wu, Tzu-Jen Chou, Yung-Cheng Lu, Syun-Ming Jang, Mong-Song Liang 2007-08-07
7193325 Reliability improvement of SiOC etch with trimethylsilane gas passivation in Cu damascene interconnects Zhen-Cheng Wu, Bi-Troug Chen, Syun-Ming Jang, Su-Horng Lin 2007-03-20
7119404 High performance strained channel MOSFETs by coupled stress effects Cheng-Hung Chang, Chu-Yun Fu 2006-10-10
7115974 Silicon oxycarbide and silicon carbonitride based materials for MOS devices Zhen-Cheng Wu, Hung Chun Tsai, Da-Wen Lin, Shwang-Ming Cheng, Mong-Song Liang 2006-10-03
7114450 Magazine for receiving electric shock bullets 2006-10-03
7002177 Test region layout for shallow trench isolation Chih-Cheng Lu, Stacey Fu, Syun-Ming Jang 2006-02-21
6929533 Methods for enhancing within-wafer CMP uniformity 2005-08-16
6828245 Method of improving an etching profile in dual damascene etching 2004-12-07