Issued Patents All Time
Showing 26–50 of 63 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9437485 | Method for line stress reduction through dummy shoulder structures | Cheng-Cheng Kuo, Tzu-Chun Lo, Ming-Hsing Tsai, Ken-Yu Chang, Jye-Yen Cheng +2 more | 2016-09-06 |
| 9418199 | Method and apparatus for extracting systematic defects | Jia-Rui Hu, Chih-Ming Ke, Kai-Hsiung Chen, Tsai-Sheng Gau | 2016-08-16 |
| 9213233 | Photolithography scattering bar structure and method | Chia-Cheng Chang, Wei-Kuan Yu, Yen-Hsu Chu, Tsai-Ming Huang, Chin-Min Huang +2 more | 2015-12-15 |
| 9201022 | Extraction of systematic defects | Jia-Rui Hu, Te-Chih Huang, Chih-Ming Ke, Tsai-Sheng Gau | 2015-12-01 |
| 9195134 | Method and apparatus for integrated circuit mask patterning | Chin-Min Huang, Bo-Han Chen, Lun-Wen Yeh, Shun-Shing Yang, Chia-Cheng Chang +2 more | 2015-11-24 |
| 9184101 | Method for removing semiconductor fins using alternating masks | Tzu-Chun Lo, Min Cheng, Hsiao-Wei Su, Jeng-Shiun Ho, Ching-Che Tsai +3 more | 2015-11-10 |
| 9070688 | Method of patterning a semiconductor device having improved spacing and shape control and a semiconductor device | Jhun Hua Chen, Yu-Lung Tung, Chi-Tien Chen, Hsiang-Lin Chen, Hung-Chang Hsieh +1 more | 2015-06-30 |
| 9026956 | Method of lithographic process evaluation | Chia-Cheng Chang, Wei-Kuan Yu, Tsai-Ming Huang, Chin-Min Huang, Cherng-Shyan Tsay +2 more | 2015-05-05 |
| 8984450 | Method and apparatus for extracting systematic defects | Jia-Rui Hu, Kai-Hsiung Chen, Chih-Mihg Ke, Tsai-Sheng Gau | 2015-03-17 |
| 8972909 | OPC method with higher degree of freedom | Chia-Cheng Chang, Jau-Shian Liang, Wen-Chen Lu, Chin-Min Huang, Ming-Hui Chih +2 more | 2015-03-03 |
| 8972912 | Structure for chip extension | Chin-Min Huang, Chia-Cheng Chang, Cherng-Shyan Tsay, Chien-Wen Lai, Kong-Beng Thei +1 more | 2015-03-03 |
| 8848163 | Photoresist materials and photolithography processes | Hsien-Cheng Wang, Chin-Hsiang Lin, Heng-Jen Lee, Ching-Yu Chang, Burn Jeng Lin | 2014-09-30 |
| 8765329 | Sub-resolution rod in the transition region | Jeng-Shiun Ho, Luke Lo, Ting-Chun Liu, Min Cheng, Jing-Wei Shih +6 more | 2014-07-01 |
| 8762900 | Method for proximity correction | Jaw-Jung Shin, Shy-Jay Lin, Burn Jeng Lin | 2014-06-24 |
| 8692351 | Dummy shoulder structure for line stress reduction | Cheng-Cheng Kuo, Luke Lo, Minghsing Tsai, Ken-Yu Chang, Jye-Yen Cheng +2 more | 2014-04-08 |
| 8656319 | Optical proximity correction convergence control | Cheng-Cheng Kuo, Ching-Che Tsai, Tzu-Chun Lo, Chih-Wei Hsu, Tsai-Sheng Gau +4 more | 2014-02-18 |
| 8589830 | Method and apparatus for enhanced optical proximity correction | Chia-Cheng Chang, Chin-Min Huang, Wei-Kuan Yu, Cherng-Shyan Tsay, Lai Chien Wen | 2013-11-19 |
| 8580637 | Method of patterning a semiconductor device having improved spacing and shape control and a semiconductor device | Jhun Hua Chen, Yu-Lung Tung, Chi-Tien Chen, Hsiang-Lin Chen, Hung-Chang Hsieh +1 more | 2013-11-12 |
| 8507177 | Photoresist materials and photolithography processes | Hsien-Cheng Wang, Chin-Hsiang Lin, Heng-Jen Lee, Ching-Yu Chang, Burn Jeng Lin | 2013-08-13 |
| D676404 | Cell phone | — | 2013-02-19 |
| 8101340 | Method of inhibiting photoresist pattern collapse | Ching-Yu Chang, Heng-Jen Lee, Chin-Hsiang Lin, Kuei-Shun Chen, Bang-Chein Ho +4 more | 2012-01-24 |
| 7972761 | Photoresist materials and photolithography process | Hsien-Cheng Wang, Chin-Hsiang Lin, H. J. Lee, Ching-Yu Chang, Burn Jeng Lin | 2011-07-05 |
| 7939222 | Method and system for improving printing accuracy of a contact layout | Jhun Hua Chen, Lai Chien Wen, Fu-Jye Liang | 2011-05-10 |
| 7399709 | Complementary replacement of material | Burn Jeng Lin, Ru-Gun Liu, Tsai-Sheng Gau, Bang-Chien Ho | 2008-07-15 |
| 7374956 | Method for improved metrology by protecting photoresist profiles | Shyeu Sheng Lu, Hong-Yuan Chu, Kuei-Shun Chen | 2008-05-20 |