Issued Patents All Time
Showing 1–25 of 61 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9744569 | Method for cleaning piping and cleaning system for piping | Takaaki Suematsu, Kenji Saito, Eiji Higashi, Tomoyuki Araki | 2017-08-29 |
| 7259104 | Sample surface processing method | Tetsuo Ono, Takafumi Tokunaga, Tadashi Umezawa, Motohiko Yoshigai, Tatsumi Mizutani +3 more | 2007-08-21 |
| 7105409 | Semiconductor integrated circuit device and process for producing the same | Takashi Kobayashi, Yasushi Goto, Hideaki Kurata, Hitoshi Kume, Katsutaka Kimura +1 more | 2006-09-12 |
| 7049243 | Surface processing method of a specimen and surface processing apparatus of the specimen | Tetsuo Ono, Yasuhiro Nishimori, Takashi Sato, Naoyuki Kofuji, Masaru Izawa +7 more | 2006-05-23 |
| 6878586 | Semiconductor memory device | Shinichiro Kimura, Naotaka Hashimoto, Yoshio Sakai, Yoshifumi Kawamoto, Toru Kaga +1 more | 2005-04-12 |
| 6849191 | Method and apparatus for treating surface of semiconductor | Tetsuo Ono, Tatsumi Mizutani, Ryouji Hamasaki, Takafumi Tokunaga, Masayuki Kojima | 2005-02-01 |
| 6797566 | Semiconductor integrated circuit device and process for producing the same | Takashi Kobayashi, Yasushi Goto, Hideaki Kurata, Hitoshi Kume, Katsutaka Kimura +1 more | 2004-09-28 |
| 6767838 | Method and apparatus for treating surface of semiconductor | Tetsuo Ono, Tatsumi Mizutani, Ryouji Hamasaki, Takafumi Tokunaga, Masayuki Kojima | 2004-07-27 |
| 6677244 | Specimen surface processing method | Tetsuo Ono, Yasuhiro Nishimori, Takashi Sato, Naoyuki Kofuji, Masaru Izawa +7 more | 2004-01-13 |
| 6660647 | Method for processing surface of sample | Tetsuo Ono, Takafumi Tokunaga, Tadashi Umezawa, Motohiko Yoshigai, Tatsumi Mizutani +3 more | 2003-12-09 |
| RE38296 | Semiconductor memory device with recessed array region | Noboru Moriuchi, Yoshiki Yamaguchi, Toshihiko Tanaka, Norio Hasegawa, Yoshifumi Kawamoto +2 more | 2003-11-04 |
| 6525336 | Superfine electronic device and method for making same | Seiichi Kondo, Yasuo Wada, Tsuyoshi Uda, Tsuneo Ichiguchi, Shinji Okazaki +1 more | 2003-02-25 |
| 6492277 | Specimen surface processing method and apparatus | Tetsuo Ono, Yasuhiro Nishimori, Takashi Sato, Naoyuki Kofuji, Masaru Izawa +7 more | 2002-12-10 |
| 6355517 | Method for fabricating semiconductor memory with a groove | Hideo Sunami, Yoshifumi Kawamoto | 2002-03-12 |
| 6114695 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 2000-09-05 |
| 5969357 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-10-19 |
| 5877498 | Method and apparatus for X-ray analyses | Aritoshi Sugimoto, Yoshimi Sudo, Ken Ninomiya, Katsuhiro Kuroda, Takashi Nishida +3 more | 1999-03-02 |
| 5866904 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-02-02 |
| 5658811 | Method of manufacturing a semiconductor device | Shinichiro Kimura, Hiromasa Noda, Nobuyoshi Kobayashi, Yasushi Goto | 1997-08-19 |
| 5594246 | Method and apparatus for x-ray analyses | Yoshimi Sudo, Ken Ninomiya, Katsuhiro Kuroda, Takashi Nishida, Hideo Todokoro +2 more | 1997-01-14 |
| 5594245 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1997-01-14 |
| 5591998 | Semiconductor memory device | Shinichiro Kimura, Naotaka Hashimoto, Yoshio Sakai, Yoshifumi Kawamoto, Toru Kaga +1 more | 1997-01-07 |
| 5583358 | Semiconductor memory device having stacked capacitors | Shinichiro Kimura, Naotaka Hashimoto, Yoshio Sakai, Yoshifumi Kawamoto, Toru Kaga +1 more | 1996-12-10 |
| 5481109 | Surface analysis method and apparatus for carrying out the same | Ken Ninomiya, Hideo Todokoro, Yasuhiro Mitsui, Katsuhiro Kuroda, Hiroyasu Shichi | 1996-01-02 |
| 5412210 | Scanning electron microscope and method for production of semiconductor device by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +2 more | 1995-05-02 |