Issued Patents All Time
Showing 1–25 of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725943 | Apparatuses and methods for transferring data from memory on a data path | — | 2020-07-28 |
| 10643686 | Memory device with an array timer mechanism | Zhi Qi Huang, Wei Lu Chu, Dong Pan | 2020-05-05 |
| 10373670 | Memory device with an array timer mechanism | Zhi Qi Huang, Wei Lu Chu, Dong Pan | 2019-08-06 |
| 10198371 | Apparatuses and methods for transferring data from memory on a data path | — | 2019-02-05 |
| 10056154 | Apparatuses and methods for flexible fuse transmission | Yoshinori Fujiwara, Kenji Yoshida, Minoru Someya | 2018-08-21 |
| 9824770 | Apparatuses and methods for flexible fuse transmission | Yoshinori Fujiwara, Kenji Yoshida, Minoru Someya | 2017-11-21 |
| 9666307 | Apparatuses and methods for flexible fuse transmission | Yoshinori Fujiwara, Kenji Yoshida, Minoru Someya | 2017-05-30 |
| RE46202 | Semiconductor memory device of open bit line type | Tetsuaki Okahiro | 2016-11-08 |
| 9412432 | Semiconductor storage device and system provided with same | Seiji Narui, Chiaki Dono, Chikara Kondo, Masayuki Nakamura | 2016-08-09 |
| 9183949 | Semiconductor device | Toshio Ninomiya | 2015-11-10 |
| 9053821 | Semiconductor device performing stress test | Yoshiro Riho, Kazuki Sakuma | 2015-06-09 |
| 8891318 | Semiconductor device having level shift circuit | Takenori Sato, Yoji Idei | 2014-11-18 |
| 8837242 | Semiconductor device and method including redundant bit line provided to replace defective bit line | Yoshiro Riho, Yoshio Mizukane | 2014-09-16 |
| 8737149 | Semiconductor device performing stress test | Yoshiro Riho, Kazuki Sakuma | 2014-05-27 |
| 8707114 | Semiconductor device including a test circuit that generates test signals to be used for adjustment on operation of an internal circuit | — | 2014-04-22 |
| 8659321 | Semiconductor device having sense amplifier | Yuko Watanabe, Yoshiro Riho, Yoji Idei, Kosuke Goto | 2014-02-25 |
| 8638625 | Semiconductor device having redundant bit line provided to replace defective bit line | Yoshiro Riho, Yoshio Mizukane | 2014-01-28 |
| 8451677 | Semiconductor device and method of refreshing the same | Tetsuaki Okahiro, Katsunobu Noguchi | 2013-05-28 |
| 8391085 | Semiconductor memory device capable of matching the timing between sub-amplifier control signal and column selection signal | Tetsuaki Okahiro, Jun Suzuki | 2013-03-05 |
| 8330487 | Semiconductor device | — | 2012-12-11 |
| 8278989 | Semiconductor device including analog circuit and digital circuit | — | 2012-10-02 |
| 8274855 | Semiconductor device for performing a refresh operation | Tetsuaki Okahiro, Katsunobu Noguchi | 2012-09-25 |
| 8198883 | Semiconductor device, internal circuit control signal measurement circuit, and delay time measurement method | Kenji Yoshida | 2012-06-12 |
| 8184498 | Semiconductor memory device | — | 2012-05-22 |
| 8068375 | Semiconductor device and method of refreshing the same | Tetsuaki Okahiro, Katsunobu Noguchi | 2011-11-29 |