Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394586 | Charged particle beam device | Makoto Sakakibara, Hajime Kawano, Makoto Suzuki, Kenji Tanimoto, Yuko Sasaki | 2025-08-19 |
| 12205790 | Charged particle beam device | Makoto Sakakibara, Hajime Kawano, Hiroya Ohta | 2025-01-21 |
| 12165828 | Electron gun and electron beam application apparatus | Takashi Ohshima, Hideo Morishita, Tatsuro Ide, Naohiro Kohmu, Yoichi Ose +2 more | 2024-12-10 |
| 12125667 | Charged particle beam device | Yasuhiro Shirasaki, Makoto Sakakibara, Hajime Kawano, Akira Ikegami | 2024-10-22 |
| 12057288 | Charged particle beam device and inspection method | Makoto Sakakibara, Hajime Kawano | 2024-08-06 |
| 11967482 | Charged particle beam device | Wen Li, Hajime Kawano, Makoto Sakakibara | 2024-04-23 |
| 11915903 | Electron beam application apparatus | Akira Ikegami, Takeshi Morimoto, Yasuhiro Shirasaki | 2024-02-27 |
| 11791130 | Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device | Koichi Hamada, Megumi Kimura, Ryou YUMIBA, Makoto Sakakibara, Kei Sakai +4 more | 2023-10-17 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Makoto Sakakibara, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |
| 11334761 | Information processing system and information processing method | Thantip Krasienapibal, Sayaka KURATA, Yasuhiro Shirasaki | 2022-05-17 |
| 11251011 | Electron microscope | Takashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Yoichi Ose, Toshihide Agemura | 2022-02-15 |
| 11177108 | Charged particle beam application apparatus | Yasuhiro Shirasaki, Takashi Dobashi, Akira Ikegami, Yuta Kawamoto | 2021-11-16 |
| 11170969 | Electron beam observation device, electron beam observation system, and control method of electron beam observation device | Koichi Hamada, Megumi Kimura, Ryou YUMIBA, Makoto Sakakibara, Kei Sakai +2 more | 2021-11-09 |
| 10755396 | Image forming apparatus | Yasuhiro Shirasaki, Michio Hatano, Makoto Sakakibara | 2020-08-25 |
| 10651004 | Charged particle beam device | Yasuhiro Shirasaki | 2020-05-12 |
| 10629405 | Electron beam device and sample inspection method | Yasunari Sohda, Megumi Kimura, Koichi Hamada | 2020-04-21 |
| 10483083 | Scanning electron microscope and image processing apparatus | Thantip Krasienapibal, Yasuhiro Shirasaki, Sayaka KURATA | 2019-11-19 |
| 10361063 | Charged particle detector and charged particle beam device using the same | Yasuhiro Shirasaki, Kaori Shirahata, Makoto Sakakibara | 2019-07-23 |
| 10319562 | Charged particle beam device | Megumi Kimura, Makoto Sakakibara | 2019-06-11 |
| 10256068 | Charged particle beam apparatus | Yasuhiro Shirasaki, Natsuki Tsuno | 2019-04-09 |
| 10037866 | Charged particle beam apparatus | Muneyuki Fukuda, Hideyuki Kazumi, Koichi Hamada, Sayaka Tanimoto | 2018-07-31 |
| 9991088 | Charged particle beam device and aberration corrector | Yasuhiro Shirasaki, Hiroya Ohta | 2018-06-05 |
| 9704687 | Charged particle beam application device | Akira Ikegami, Hideto Dohi, Hideyuki Kazumi, Naomasa Suzuki | 2017-07-11 |
| 9653256 | Charged particle-beam device | Akira Ikegami, Hideto Dohi, Hideyuki Kazumi, Yoichi Ose, Naomasa Suzuki +2 more | 2017-05-16 |
| 9384940 | Charged particle beam apparatus | Muneyuki Fukuda, Naomasa Suzuki, Akira Ikegami, Hideto Dohi, Tomoyasu Shojo | 2016-07-05 |