Issued Patents All Time
Showing 26–32 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8907278 | Charged particle beam applied apparatus, and irradiation method | Hiroya Ota, Taku Ninomiya, Mari Nozoe | 2014-12-09 |
| 8592776 | Charged particle beam apparatus | Hiroya Ohta, Osamu Kamimura | 2013-11-26 |
| 8552373 | Charged particle beam device and sample observation method | Hiroya Ohta, Taku Ninomiya, Mari Nozoe | 2013-10-08 |
| 8350214 | Charged particle beam applied apparatus | Hiroki Otaki, Hiroya Ohta | 2013-01-08 |
| 8330103 | Charged particle beam apparatus and specimen inspection method | Hiroya Ohta | 2012-12-11 |
| 7755776 | Inspection system and inspection method | Hiroshi Makino, Masaki Hasegawa | 2010-07-13 |
| 7504624 | Charged particle beam device | Takeshi Kawasaki, Tomonori Nakano, Michio Hatano | 2009-03-17 |