MP

Michael L. Passow

IBM: 12 patents #9,222 of 70,183Top 15%
Overall (All Time): #417,342 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10120103 Intelligent/autonomous thermocline mapping and monitoring for marine and freshwater applications Eli M. Dow, Michael R. Kelly, Harry R. Kolar 2018-11-06
9575554 Dynamic time sliced sensor sampling for reduced power consumption Eli M. Dow, Michael R. Kelly, Harry R. Kolar 2017-02-21
9395219 Ring-based monitoring of sensor mesh networks Eli M. Dow, Michael R. Kelly, Harry R. Kolar 2016-07-19
7570174 Real time alarm classification and method of use Joseph Byrne, Harry D. Clark, Gary R. Moore, Yiheng Xu 2009-08-04
6296717 Regeneration of chemical mechanical polishing pads in-situ Adam D. Ticknor, Karl E. Boggs, Kenneth M. Davis, William Francis Landers 2001-10-02
6268226 Reactive ion etch loading measurement technique David Angell, Stuart M. Burns, Waldemar Walter Kocon 2001-07-31
6207353 Resist formulation which minimizes blistering during etching Michael D. Armacost, Willard E. Conley, Tina J. Cotler-Wagner, Ronald A. DellaGuardia, David M. Dobuzinsky +1 more 2001-03-27
6102776 Apparatus and method for controlling polishing of integrated circuit substrates Karl E. Boggs, Kenneth M. Davis, William Francis Landers, Robert M. Merkling, Jr., Jeremy K. Stephens 2000-08-15
5811357 Process of etching an oxide layer Michael D. Armacost, Tina Wagner, Dominic J. Schepis, Matthew Sendelbach, William C. Wille 1998-09-22
5534066 Fluid delivery apparatus having an infrared feedline sensor James A. O'Neill, Tina J. Cotler, Jonathan D. Chapple-Sokol, Richard A. Conti, Jyothi Singh 1996-07-09
5492718 Fluid delivery apparatus and method having an infrared feedline sensor James A. O'Neill, Tina J. Cotler, Jonathan D. Chapple-Sokol, Richard A. Conti, Jyothi Singh 1996-02-20
5308414 Method and apparatus for optical emission end point detection in plasma etching processes James A. O'Neill, Jyothi Singh 1994-05-03