Jyothi Singh — 14 Patents at IBM

Jyothi Singh has been granted 14 US patents while listed as an inventor at IBM. The first was granted in 1989 and the most recent in September 2001. Jyothi Singh ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Jyothi Singh in Hopewell Junction, NY, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6291833	Apparatus for mapping scratches in an oxide film	William Francis Landers	2001-09-18	$29,045,000
6048745	Method for mapping scratches in an oxide film	William Francis Landers	2000-04-11	$38,584,000
5993059	Combined emissivity and radiance measurement for determination of temperature of radiant object	James A. O'Neill	1999-11-30	$27,589,000
5953115	Method and apparatus for imaging surface topography of a wafer	William Francis Landers	1999-09-14	$25,256,000
5770097	Control of etch selectivity	James A. O'Neill	1998-06-23	$13,396,000
5738440	Combined emissivity and radiance measurement for the determination of the temperature of a radiant object	James A. O'Neill	1998-04-14	$13,289,000
5683538	Control of etch selectivity	James A. O'Neill	1997-11-04	$29,270,000
5534066	Fluid delivery apparatus having an infrared feedline sensor	James A. O'Neill, Michael L. Passow, Tina J. Cotler, Jonathan D. Chapple-Sokol, Richard A. Conti	1996-07-09	$6,020,000
5492718	Fluid delivery apparatus and method having an infrared feedline sensor	James A. O'Neill, Michael L. Passow, Tina J. Cotler, Jonathan D. Chapple-Sokol, Richard A. Conti	1996-02-20	$16,018,000
5387777	Methods and apparatus for contamination control in plasma processing	Reid S. Bennett, Albert R. Ellingboe, George G. Gifford, Kurt L. Haller, John S. McKillop +1 more	1995-02-07	$10,783,000
5382911	Reaction chamber interelectrode gap monitoring by capacitance measurement	Tina J. Cotler, John C. Forster, Lawrence Andrew Kropp	1995-01-17	$19,874,000
5367139	Methods and apparatus for contamination control in plasma processing	Reid S. Bennett, Albert R. Ellingboe, George G. Gifford, Kurt L. Haller, John S. McKillop +1 more	1994-11-22	$8,506,000
5308414	Method and apparatus for optical emission end point detection in plasma etching processes	James A. O'Neill, Michael L. Passow	1994-05-03	$7,556,000
4846920	Plasma amplified photoelectron process endpoint detection apparatus	John H. Keller, Gary S. Selwyn	1989-07-11	$12,654,000

Jyothi Singh — 14 Patents

Issued Patents All Time

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