TH

Terence B. Hook

IBM: 192 patents #172 of 70,183Top 1%
Globalfoundries: 8 patents #444 of 4,424Top 15%
GU Globalfoundries U.S.: 5 patents #206 of 665Top 35%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
TE Tessera: 1 patents #207 of 271Top 80%
📍 Jericho Center, VT: #1 of 5 inventorsTop 20%
🗺 Vermont: #17 of 4,968 inventorsTop 1%
Overall (All Time): #3,106 of 4,157,543Top 1%
207
Patents All Time

Issued Patents All Time

Showing 151–175 of 207 patents

Patent #TitleCo-InventorsDate
8513106 Pseudo butted junction structure for back plane connection 2013-08-20
8431955 Method and structure for balancing power and performance using fluorine and nitrogen doped substrates Brent A. Anderson 2013-04-30
8416009 Solutions for controlling bulk bias voltage in an extremely thin silicon-on-insulator (ETSOI) integrated circuit chip Hayden C. Cranford, Jr. 2013-04-09
8407656 Method and structure for a transistor having a relatively large threshold voltage variation range and for a random number generator incorporating multiple essentially identical transistors having such a large threshold voltage variation range Jeffrey B. Johnson 2013-03-26
8230586 Method of cooling a resistor Douglas D. Coolbaugh, Ebenezer E. Eshun, Robert M. Rassel, Edmund J. Sprogis, Anthony K. Stamper +1 more 2012-07-31
8012848 Trench isolation and method of fabricating trench isolation Jeffrey B. Johnson, James S. Nakos 2011-09-06
7994895 Heat sink for integrated circuit devices Douglas D. Coolbaugh, Ebenezer E. Eshun, Robert M. Rassel, Edmund J. Sprogis, Anthony K. Stamper +1 more 2011-08-09
7939894 Isolated high performance FET with a controllable body resistance Jenny Hu, Jae-Eun Park 2011-05-10
7928513 Protection against charging damage in hybrid orientation transistors Anda C. Mocuta, Jeffrey W. Sleight, Anthony K. Stamper 2011-04-19
7879650 Method of providing protection against charging damage in hybrid orientation transistors Anda C. Mocuta, Jeffrey W. Sleight, Anthony K. Stamper 2011-02-01
7863112 Method and structure to protect FETs from plasma damage during FEOL processing Deleep R. Nair 2011-01-04
7824933 Method of determining n-well scattering effects on FETs Micah Galland 2010-11-02
7785979 Integrated circuits comprising resistors having different sheet resistances and methods of fabricating the same Roger A. Booth, Jr., Kangguo Cheng 2010-08-31
7712057 Determining allowance antenna area as function of total gate insulator area for SOI technology Henry A. Bonges, III, William F. Pokorny, Jeffrey S. Zimmerman 2010-05-04
7709365 CMOS well structure and method of forming the same Wilfried E. Haensch, Louis C. Hsu, Rajiv V. Joshi, Werner Rausch 2010-05-04
7682910 Method of selectively adjusting ion implantation dose on semiconductor devices Gerald L. Leake 2010-03-23
7649262 Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing Jonathan D. Chapple-Sokol, Baozhen Li, Thomas L. McDevitt, Christopher A. Ponsolle, Bette B. Reuter +2 more 2010-01-19
7615827 Dual gate dielectric thickness devices and circuits using dual gate dielectric thickness devices Brent A. Anderson 2009-11-10
7572650 Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing Jonathan D. Chapple-Sokol, Baozhen Li, Thomas L. McDevitt, Christopher A. Ponsolle, Bette B. Reuter +2 more 2009-08-11
7566946 Precision passive circuit structure Douglas D. Coolbaugh, Hayden C. Cranford, Jr., Anthony K. Stamper 2009-07-28
7560345 Method of assessing potential for charging damage in integrated circuit designs and structures for preventing charging damage Jeffrey S. Zimmerman 2009-07-14
7516426 Methods of improving operational parameters of pair of matched transistors and set of transistors Jeffrey B. Johnson, Yoo-Mi Lee 2009-04-07
7492016 Protection against charging damage in hybrid orientation transistors Anda C. Mocuta, Jeffrey W. Sleight, Anthony K. Stamper 2009-02-17
7470959 Integrated circuit structures for preventing charging damage Jeffery Scott Zimmerman 2008-12-30
7310036 Heat sink for integrated circuit devices Douglas D. Coolbaugh, Ebenezer E. Eshun, Robert M. Rassel, Edmund J. Sprogis, Anthony K. Stamper +1 more 2007-12-18