Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10101388 | Method for enhanced semiconductor product diagnostic fail signature detection | Robert C. Redburn, Andrew A. Turner | 2018-10-16 |
| 9000585 | Structure, semiconductor structure and method of manufacturing a semiconductor structure and packaging thereof | Timothy H. Daubenspeck, Jeffrey P. Gambino, Christopher D. Muzzy, Wolfgang Sauter | 2015-04-07 |
| 8990478 | Protection of one-time programmable (OTP) memory | John A. Fifield, Gerald P. Pomichter, Jr. | 2015-03-24 |
| 8114767 | Structure, semiconductor structure and method of manufacturing a semiconductor structure and packaging thereof | Timothy H. Daubenspeck, Jeffrey P. Gambino, Christopher D. Muzzy, Wolfgang Sauter | 2012-02-14 |
| 7958477 | Structure, failure analysis tool and method of determining white bump location using failure analysis tool | Timothy H. Daubenspeck, Jeffrey P. Gambino, Christopher D. Muzzy, Wolfgang Sauter | 2011-06-07 |
| 7716992 | Sensor, method, and design structure for a low-k delamination sensor | John J. Maloney, Wolfgang Sauter, Thomas A. Wassick | 2010-05-18 |
| 7712057 | Determining allowance antenna area as function of total gate insulator area for SOI technology | Henry A. Bonges, III, Terence B. Hook, William F. Pokorny | 2010-05-04 |
| 7649262 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Thomas L. McDevitt, Christopher A. Ponsolle +2 more | 2010-01-19 |
| 7572650 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Thomas L. McDevitt, Christopher A. Ponsolle +2 more | 2009-08-11 |
| 7560345 | Method of assessing potential for charging damage in integrated circuit designs and structures for preventing charging damage | Terence B. Hook | 2009-07-14 |
| 7232695 | Method and apparatus for completely covering a wafer with a passivating material | Timothy H. Daubenspeck, Jeffrey P. Gambino, Christopher D. Muzzy, Wolfgang Sauter | 2007-06-19 |
| 7173338 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Thomas L. McDevitt, Christopher A. Ponsolle +2 more | 2007-02-06 |
| 6949796 | Halo implant in semiconductor structures | John J. Ellis-Monaghan, Kirk D. Peterson | 2005-09-27 |
| 6937965 | Statistical guardband methodology | Mark R. Bilak, Joseph M. Forbes, Curt Guenther, Michael J. Maloney, Michael D. Maurice +2 more | 2005-08-30 |
| 6226976 | Variable fuel heating value adaptive control for gas turbine engines | Michael Scott | 2001-05-08 |
| 6097207 | Robust domino circuit design for high stress conditions | Kerry Bernstein, Norman J. Rohrer | 2000-08-01 |
| 5633605 | Dynamic bus with singular central precharge | John A. Fifield, Christopher P. Miller, Robert E. Busch | 1997-05-27 |
| 5625631 | Pass through mode for multi-chip-module die | George W. Rohrbaugh, III | 1997-04-29 |